Nanomanipulation in a scanning electron microscope

被引:70
作者
Fahlbusch, S
Mazerolle, S
Breguet, JM
Steinecker, A
Agnus, J
Pérez, R
Michler, J
机构
[1] Empa, Mat Sci & Technol, CH-3602 Thun, Switzerland
[2] Ecole Polytech Fed Lausanne, Swiss Fed Inst Technol, Lab Syst Robot, CH-1015 Lausanne, Switzerland
[3] CSEM, CH-6055 Alpnach Dorf, Switzerland
[4] UFC, CNRS, LAB, UMR 6596,ENSMM, F-25000 Besancon, France
关键词
nanomanipulation; nanotools; microgripper; scanning electron microscope; visual control; carbon nanotubes;
D O I
10.1016/j.jmatprotec.2005.06.022
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An increasing variety of nano-scale products and devices in key application areas like nanoelectronics, nanotechnology and biotechnology demands novel tools for three-dimensional handling, assembly, characterisation and testing of fundamental building blocks like nanotubes and nanowires. In this paper, the state of the art in nanomanipulation systems based on a bottom-up technology for the manufacturing of nano-devices is reviewed, and a novel sensor-based manipulation and processing system for nano-scale objects which can be integrated in a scanning electron microscope (SEM) is presented. A series of tools for nanopositioning, nanomampulation and microgripping devices has been developed. The control and vision system is based on a client-server approach to ensure positioning task execution and SEM image processing in real-time. The evaluation of the nanomanipulation system is shown by means of gripping of micro-sized powder particles, and by the attachment of carbon nanotubes on tips for atomic force microscopes. With future enhancements, which are currently under development, like a micro-tools exchanger, this system is expected to be a valuable tool for research laboratories and in industry for rapid prototyping in the nano-world. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:371 / 382
页数:12
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