Electrical properties of Au-polystyrene-Au submicron structures

被引:11
作者
Efimenko, K [1 ]
Rybka, V
Svorcik, V
Hnatowicz, V
机构
[1] Inst Chem Technol, Dept Solid State Engn, Prague 16628 6, Czech Republic
[2] Acad Sci Czech Republ, Inst Phys Nucl, Prague 25968, Czech Republic
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1998年 / 67卷 / 05期
关键词
PACS: 72.20.-i; 73.60.Ay;
D O I
10.1007/s003390050811
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Electrical forming and voltage-current characteristics of Au-polystyrene-Au (MIM) structures created on a glassy substrate were studied. Polystyrene (PS) isolating films, 180-800nm thick, were prepared by spinning from a solution. It was shown that the electroforming of MIM structures occurs at the voltage of 6-6.5 V and that the shaping rate depends on the insulator thickness, temperature, and the shaping time. The voltage-current characteristics exhibit a region with ohmic behaviour and, above a certain voltage, a region with effective negative resistance. The negative resistance is explained by deterioration of conductive Au filaments at higher voltages. The voltage decrease does not result in a complete recovery of all filaments.
引用
收藏
页码:503 / 505
页数:3
相关论文
共 13 条
[1]   ELECTRON-EMISSION AND RELATED PROPERTIES OF AMORPHOUS THIN-FILMS OF MIXED BARIUM AND SILICON OXIDES [J].
ABIDI, A ;
HOGARTH, CA .
THIN SOLID FILMS, 1974, 22 (02) :203-214
[2]  
Dearnaley G., 1970, Journal of Non-Crystalline Solids, V4, P593, DOI 10.1016/0022-3093(70)90097-9
[3]   ANGULAR-DISTRIBUTION MEASUREMENTS OF ELECTRONS EMITTED FROM THIN-FILM AU-SIOX-AU DIODE AND TRIODE STRUCTURES [J].
GOULD, RD ;
HOGARTH, CA .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1977, 41 (02) :439-442
[4]   LOW-FREQUENCY NEGATIVE RESISTANCE IN THIN ANODIC OXIDE FILMS [J].
HICKMOTT, TW .
JOURNAL OF APPLIED PHYSICS, 1962, 33 (09) :2669-&
[5]   ELECTROFORMING OF THIN-FILMS OF POLYPROPYLENE [J].
HOGARTH, CA ;
IQBAL, T .
INTERNATIONAL JOURNAL OF ELECTRONICS, 1979, 47 (04) :349-353
[6]   SOME OBSERVATIONS OF VOLTAGE-INDUCED CONDUCTANCE CHANGES IN THIN-FILMS OF EVAPORATED POLYETHYLENE [J].
HOGARTH, CA ;
ZOR, M .
THIN SOLID FILMS, 1975, 27 (01) :L5-L7
[7]   ANGULAR DISTRIBUTION OF ELECTRONS EMITTED FROM THIN-FILM MIM STRUCTURES AT VARIOUS TEMPERATURES [J].
HRACH, R ;
MAY, J .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1971, 4 (03) :637-&
[8]  
KREYNINA GS, 1960, RAD ENG ELECT, V5, P299
[9]   ELECTRICAL CHARACTERISTICS OF RF-SPUTTERED AL2O3 MIM STRUCTURES [J].
RAHMAN, A ;
RAVEN, MS .
THIN SOLID FILMS, 1980, 71 (01) :7-13
[10]   RECENT ADVANCES IN THE POLYFILAMENTARY MODEL FOR ELECTRONIC CONDUCTION IN ELECTROFORMED INSULATING FILMS [J].
RAY, AK ;
HOGARTH, CA .
INTERNATIONAL JOURNAL OF ELECTRONICS, 1990, 69 (01) :97-107