Encapsulation of organic light-emitting diode using thermal chemical-vapour-deposition polymer film

被引:65
作者
Yamashita, K [1 ]
Mori, T
Mizutani, T
机构
[1] Nagoya Univ, Grad Sch Engn, Dept Elect Engn, Nagoya, Aichi 4648603, Japan
[2] Nippon Steel Chem Co Ltd, Tobata Ku, Kitakyushu, Fukuoka 8048503, Japan
关键词
D O I
10.1088/0022-3727/34/5/312
中图分类号
O59 [应用物理学];
学科分类号
摘要
The encapsulation effect of thermal chemical-vapour-deposition polymer films (TCVDPF) has been studied for organic light-emitting diodes (OLED). We used poly-p-xylylene (PPX) and/or poly-2-chloro-p-xylylene (PCPX) films as TCVDPE For the encapsulation, TCVDPF was deposited on the OLED during a dry process at room temperature. The lifetime of an encapsulated OLED with 0.6 mum thick TCVDPF was about four times longer than that of a non-encapsulated OLED in air. The lifetime of the OLED increased with increasing thickness of the TCVDPE We conclude that the effect of TCVDPF encapsulation on the long-term stability of the OLED is due to the prevention of oxygen and moisture in air and several other factors.
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收藏
页码:740 / 743
页数:4
相关论文
共 13 条
[1]   Humidity-induced crystallization of tris (8-hydroxyquinoline) aluminum layers in organic light-emitting devices [J].
Aziz, H ;
Popovic, Z ;
Xie, S ;
Hor, AM ;
Hu, NX ;
Tripp, C ;
Xu, G .
APPLIED PHYSICS LETTERS, 1998, 72 (07) :756-758
[2]   Degradation processes at the cathode/organic interface in organic light emitting devices with Mg:Ag cathodes [J].
Aziz, H ;
Popovic, Z ;
Tripp, CP ;
Hu, NX ;
Hor, AM ;
Xu, G .
APPLIED PHYSICS LETTERS, 1998, 72 (21) :2642-2644
[3]   RELIABILITY AND DEGRADATION OF ORGANIC LIGHT-EMITTING DEVICES [J].
BURROWS, PE ;
BULOVIC, V ;
FORREST, SR ;
SAPOCHAK, LS ;
MCCARTY, DM ;
THOMPSON, ME .
APPLIED PHYSICS LETTERS, 1994, 65 (23) :2922-2924
[4]   OBSERVATION OF DEGRADATION PROCESSES OF AL ELECTRODES IN ORGANIC ELECTROLUMINESCENCE DEVICES BY ELECTROLUMINESCENCE MICROSCOPY, ATOMIC FARCE MICROSCOPY, SCANNING ELECTRON-MICROSCOPY, AND ANGER ELECTRON-SPECTROSCOPY [J].
DO, LM ;
HAN, EM ;
NIIDOME, Y ;
FUJIHIRA, M ;
KANNO, T ;
YOSHIDA, S ;
MAEDA, A ;
IKUSHIMA, AJ .
JOURNAL OF APPLIED PHYSICS, 1994, 76 (09) :5118-5121
[5]   Growth of dark spots by interdiffusion across organic layers in organic electroluminescent devices [J].
Fujihira, M ;
Do, LM ;
Koike, A ;
Han, EM .
APPLIED PHYSICS LETTERS, 1996, 68 (13) :1787-1789
[6]   Crystallization of organic thin films for electroluminescent devices [J].
Han, EM ;
Do, LM ;
Yamamoto, N ;
Fujihira, M .
THIN SOLID FILMS, 1996, 273 (1-2) :202-208
[7]   Nuclei of dark spots in organic EL devices: detection by DFM and observation of the microstructure by TEM [J].
Kawaharada, M ;
Ooishi, M ;
Saito, T ;
Hasegawa, E .
SYNTHETIC METALS, 1997, 91 (1-3) :113-116
[8]  
KAWAMI S, 1998, 45 SPRING M JPN SOC, P1223
[9]   Formation and growth of black spots in organic light-emitting diodes [J].
McElvain, J ;
Antoniadis, H ;
Hueschen, MR ;
Miller, JN ;
Roitman, DM ;
Sheats, JR ;
Moon, RL .
JOURNAL OF APPLIED PHYSICS, 1996, 80 (10) :6002-6007
[10]   A STUDY OF THE ELECTROLUMINESCENCE PROCESS OF AN ORGANIC ELECTROLUMINESCENCE DIODE WITH AN ALQ3 EMISSION LAYER USING A DYE-DOPING METHOD [J].
MORI, T ;
MIYACHI, K ;
MIZUTANI, T .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1995, 28 (07) :1461-1467