Monocrystalline silicon carbide nanoelectromechanical systems

被引:243
作者
Yang, YT [1 ]
Ekinci, KL
Huang, XMH
Schiavone, LM
Roukes, ML
Zorman, CA
Mehregany, M
机构
[1] CALTECH, Pasadena, CA 91125 USA
[2] Case Western Reserve Univ, Dept Elect Engn & Comp Sci, Cleveland, OH 44106 USA
关键词
D O I
10.1063/1.1338959
中图分类号
O59 [应用物理学];
学科分类号
摘要
SiC is an extremely promising material for nanoelectromechanical systems given its large Young's modulus and robust surface properties. We have patterned nanometer scale electromechanical resonators from single-crystal 3C-SiC layers grown epitaxially upon Si substrates. A surface nanomachining process is described that involves electron beam lithography followed by dry anisotropic and selective electron cyclotron resonance plasma etching steps. Measurements on a representative family of the resulting devices demonstrate that, for a given geometry, nanometer-scale SiC resonators are capable of yielding substantially higher frequencies than GaAs and Si resonators. (C) 2001 American Institute of Physics.
引用
收藏
页码:162 / 164
页数:3
相关论文
共 15 条
[1]  
AULD BA, 1990, ACOUSTIC FIELDS WAVE, V1, pCH6
[2]   Fabrication of high frequency nanometer scale mechanical resonators from bulk Si crystals [J].
Cleland, AN ;
Roukes, ML .
APPLIED PHYSICS LETTERS, 1996, 69 (18) :2653-2655
[3]   External control of dissipation in a nanometer-scale radiofrequency mechanical resonator [J].
Cleland, AN ;
Roukes, ML .
SENSORS AND ACTUATORS A-PHYSICAL, 1999, 72 (03) :256-261
[4]   ELASTIC-CONSTANTS OF GAAS FROM 2 K TO 320 K [J].
COTTAM, RI ;
SAUNDERS, GA .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1973, 6 (13) :2105-2118
[5]   Surface micromachining of polycrystalline SiC deposited on SiO2 by APCVD [J].
Fleischman, AJ ;
Wei, X ;
Zorman, CA ;
Mehregany, M .
SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2, 1998, 264-2 :885-888
[6]   ELECTRONIC EFFECTS IN ELASTIC CONSTANTS OF N-TYPE SILICON [J].
HALL, JJ .
PHYSICAL REVIEW, 1967, 161 (03) :756-&
[7]   RECENT DEVELOPMENTS IN SIC SINGLE-CRYSTAL ELECTRONICS [J].
IVANOV, PA ;
CHELNOKOV, VE .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1992, 7 (07) :863-880
[8]   CALCULATED ELASTIC-CONSTANTS AND DEFORMATION POTENTIALS OF CUBIC SIC [J].
LAMBRECHT, WRL ;
SEGALL, B ;
METHFESSEL, M ;
VANSCHILFGAARDE, M .
PHYSICAL REVIEW B, 1991, 44 (08) :3685-3694
[9]   Silicon carbide MEMS for harsh environments [J].
Mehregany, M ;
Zorman, CA ;
Rajan, N ;
Wu, CH .
PROCEEDINGS OF THE IEEE, 1998, 86 (08) :1594-1610
[10]   YOUNGS MODULUS MEASUREMENTS OF THIN-FILMS USING MICROMECHANICS [J].
PETERSEN, KE ;
GUARNIERI, CR .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (11) :6761-6766