Influence of channel doping-profile on camel-gate field effect transistors

被引:22
作者
Lour, WS [1 ]
Tsai, JH [1 ]
Laih, LW [1 ]
Liu, WC [1 ]
机构
[1] NATL CHENG KUNG UNIV,DEPT ELECT ENGN,TAINAN 70101,TAIWAN
关键词
D O I
10.1109/16.502117
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report the performance of GaAs camel-gate FET's and its dependence on device parameters, In particular, the performance dependence on the doping-profile of a channel was investigated, In this study, one-step, bi-step, and tri-step doping channels with the same doping-thickness product are employed in camel-gate FET's, while keeping other parameters unchanged, For a one-step doping channel FET, theoretical analysis reveals that a high doping channel would provide a large transconductance which is suitable for logic applications. Decreasing the channel concentration increases the drain current and the barrier height. For a tri-step doping channel FET, it is found that the output drain current and the barrier height remain large and the relatively voltage-independent transconductance is also increased, These are the requirements for the large input signal power amplifiers, A fabricated camel-gate FET with a tri-step doping channel exhibits a large drain current density larger than 750 mA/mm and a potential barrier greater than 1.0 V. Furthermore, the relatively voltage-independent transconductance is as high as 220 mS/mm and the applied gate voltage is up to +1.5 V. A 1.5 x 100 mu m(2) device is found to have a f(t) of 30 GHz with a very low input capacitance.
引用
收藏
页码:871 / 876
页数:6
相关论文
共 13 条
[1]   W-BAND GAAS CAMEL-CATHODE GUNN DEVICES PRODUCED BY MBE [J].
BEALL, RB ;
BATTERSBY, SJ ;
GRECIAN, PJ ;
JONES, S ;
SMITH, G .
ELECTRONICS LETTERS, 1989, 25 (13) :871-873
[2]   2-LAYER MICROWAVE FET STRUCTURE FOR IMPROVED CHARACTERISTICS [J].
DAS, MB ;
ESQUEDA, P .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1977, 24 (06) :757-761
[3]   AN IN0.52AL0.48AS/N+-IN0.53GA0.47AS MISFET WITH A HEAVILY DOPED CHANNEL [J].
DELALAMO, JA ;
MIZUTANI, T .
IEEE ELECTRON DEVICE LETTERS, 1987, 8 (11) :534-536
[4]   GAAS SEMICONDUCTOR-INSULATOR-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR WITH A PLANAR-DOPED BARRIER GATE [J].
FIGUEREDO, DA ;
ZURAKOWSKI, MP ;
ELLIOTT, SS ;
ANKLAM, WJ ;
SLOAN, SR .
APPLIED PHYSICS LETTERS, 1988, 52 (17) :1395-1397
[5]   A HIGH-CURRENT DRIVABILITY I-ALGAAS/N-GAAS DOPED-CHANNEL MIS-LIKE FET (DMT) [J].
HIDA, H ;
OKAMOTO, A ;
TOYOSHIMA, H ;
OHATA, K .
IEEE ELECTRON DEVICE LETTERS, 1986, 7 (11) :625-626
[6]   ILLUMINATED BALLISTIC CAMEL DIODE - A NEW OPTOELECTRONIC NEGATIVE-RESISTANCE DEVICE [J].
LEHOVEC, K .
ELECTRONICS LETTERS, 1988, 24 (13) :803-804
[7]   SIGE/SI CAMEL-BARRIER HETEROJUNCTION INTERNAL PHOTOEMISSION LWIR DETECTOR [J].
LIN, TL ;
DEJEWSKI, SM ;
KSENDZOV, A ;
JONES, EW .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1991, 38 (12) :2696-2696
[8]   A NOVEL, VERY HIGH BREAKDOWN VOLTAGE, FIELD-EFFECT TRANSISTOR PREPARED BY MOLECULAR-BEAM EPITAXY [J].
LIU, WC ;
LOUR, WS ;
SUN, CY ;
CHEN, HR .
THIN SOLID FILMS, 1991, 195 (1-2) :1-6
[9]   CALCULATION OF MICROWAVE PERFORMANCE OF BUFFER LAYER GATE GAAS MESFET [J].
NAGASHIMA, A ;
UMEBACHI, S ;
KANO, G .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1978, 25 (05) :537-539
[10]   MAJORITY-CARRIER CAMEL DIODE [J].
SHANNON, JM .
APPLIED PHYSICS LETTERS, 1979, 35 (01) :63-65