Determination of cross sectional variation of ferroelectric properties for thin film (Ca. 500 nm) PZT (30/70) via PFM

被引：11

作者：

Dunn, S ^{[1
]}

机构：

[1] Cranfield Univ, Nanotechnol Grp, Cranfield MK43 0AL, Beds, England

来源：

INTEGRATED FERROELECTRICS | 2003年 / 59卷

基金：

英国工程与自然科学研究理事会;

关键词：

D O I：

10.1080/10584580390259993

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

[No abstract available]

引用

页码：1505 / 1512

页数：8

共 19 条

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