Krypton adsorption technique for assessment of structural properties of mesoporous silica and titania thin films

被引：6

作者：

Bartels, O

Zukal, A

机构：

[1] Univ Hannover, Inst Phys Chem & Electrochem, D-30167 Hannover, Germany

[2] Acad Sci Czech Republ, J Heyrovsky Inst Phys Chem, CZ-18223 Prague, Czech Republic

来源：

JOURNAL OF MATERIALS SCIENCE | 2005年 / 40卷 / 9-10期

关键词：

D O I：

10.1007/s10853-005-2085-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：2603 / 2605

页数：3

共 10 条

[1]

Ayral A, 1998, J MATER SCI LETT, V17, P883, DOI 10.1023/A:1026428814961

[2]

CHAO KJ, 2004, P 14 INT ZEOL C, P1363

[3] PORE STRUCTURE CHARACTERIZATION OF THIN-FILMS USING A SURFACE ACOUSTIC-WAVE VOLUMETRIC ADSORPTION TECHNIQUE [J].

HIETALA, SL ;

SMITH, DM ;

HIETALA, VM ;

FRYE, GC ;

MARTIN, SJ .

LANGMUIR, 1993, 9 (01) :249-251

[4] Surfactant-templated TiO2 (anatase):: Characteristic features of lithium insertion electrochemistry in organized nanostructures [J].

Kavan, L ;

Rathousky, J ;

Grätzel, M ;

Shklover, V ;

Zukal, A .

JOURNAL OF PHYSICAL CHEMISTRY B, 2000, 104 (50) :12012-12020

[5]

ROUQUEROL F, 1999, ADSORPTION POWDERS P, P62

[6] Measurement of pore size distribution of low-surface-area materials by krypton gas adsorption method [J].

Takei, T ;

Chikazawa, M .

JOURNAL OF THE CERAMIC SOCIETY OF JAPAN, 1998, 106 (04) :353-357

[7] Precision evaluation in Kr adsorption for small BET surface area measurements of less than 1 m2 [J].

Yanazawa, H ;

Ohshika, K ;

Matsuzawa, T .

ADSORPTION-JOURNAL OF THE INTERNATIONAL ADSORPTION SOCIETY, 2000, 6 (01) :73-77

[8] Development of the ultra-high-sensitive Kr adsorption technique to evaluate the pore-size distribution of thin-film materials [J].

Yanazawa, H ;

Mastunaga, H ;

Itoh, H ;

Nakai, K ;

Suzuki, I .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2002, 20 (05) :1833-1835

[9]

Zhao D, 1998, ADV MATER, V10, P1380, DOI 10.1002/(SICI)1521-4095(199811)10:16<1380::AID-ADMA1380>3.0.CO

[10]

2-8

← 1 →