共 21 条
Optical properties of microcrystalline materials
被引:66
作者:
Vanecek, M
Poruba, A
Remes, Z
Beck, N
Nesladek, M
机构:
[1] Acad Sci Czech Republ, Inst Phys, CZ-16200 Praha 6, Czech Republic
[2] Univ Neuchatel, Inst Microtechnol, CH-2000 Neuchatel, Switzerland
[3] Limburgs Univ, Inst Mat Res, B-3590 Diepenbeek, Belgium
关键词:
microcrystalline silicon;
thin films;
diamonds;
D O I:
10.1016/S0022-3093(98)00202-6
中图分类号:
TQ174 [陶瓷工业];
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
We use optical, photocurrent and photothermal deflection spectroscopies to study defects in microcrystalline silicon (mu c-Si) thin films and diamond layers. Enhanced light absorption in mu c-Si films and solar cells is due to several contributions: light scattering, change in the optical transition probability for strained and surface atoms and residual amorphous fraction. Low defect density (optical absorption with a coefficient, alpha, smaller than 0.1 cm(-1) at about 0.8 eV, as measured by the constant photocurrent method), amorphous volume fraction below 10% and a distinct surface texture is typical for a material yielding a good efficiency mu c-Si solar cells. Main defects in heteroepitaxial chemical vapor deposition diamond films are discussed. (C) 1998 Elsevier Science B.V. All rights reserved.
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页码:967 / 972
页数:6
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