Reflectance-difference spectroscopy of adsorbate-covered GaAs(100) surfaces: a combined surface science and in-situ OMVPE study

被引:36
作者
Creighton, JR [1 ]
Baucom, KC [1 ]
机构
[1] Sandia Natl Labs, Dept 1126, Albuquerque, NM 87185 USA
基金
美国能源部;
关键词
Auger electron spectroscopy (AES); chemical vapor deposition; chemisorption; gallium arsenide; low energy electron diffraction (LEED); reflection spectroscopy; thermal desorption; thermal desorption spectroscopy; trimethyl gallium;
D O I
10.1016/S0039-6028(98)00291-X
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Using two experimental approaches, we have examined the role of adsorbates during organometallic vapor phase epitaxy (OMVPE) and atomic layer epitaxy (ALE). One set of experiments extended the RDS database to include well-defined CaAs(100) reconstructions involving CHx adsorbates, whereas the other experiments examined the RD spectra over a wide range of OMVPE conditions. We have found that the Type III OMVPE condition present at lower temperatures and higher TMGa concentration is due to a newly discovered As-rich (1 x 2)-CH3 reconstruction. The ALE condition following the trimethylgallium exposure cycle is due to the presence of a Ga-rich (1 x 4)-CH2 reconstruction. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:372 / 383
页数:12
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