Real-time, micrometer depth-resolved imaging by low-coherence reflectometry and a two-dimensional heterodyne detection technique

被引：16

作者：

Akiba, M

Chan, KP

Tanno, N

机构：

[1] Yamagata Prefecture, Reg Joint Res Project, Japan Sci & Technol Corp, Yamagata 9902473, Japan

[2] Yamagata Univ, Grad Sch Sci & Engn, Yonezawa, Yamagata 9928510, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 2000年 / 39卷 / 11B期

关键词：

low-coherence reflectometry; optical coherence tomography; two-dimensional heterodyne detection; interferometric imaging; frequency synchronous detection;

D O I：

10.1143/JJAP.39.L1194

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A novel two-dimensional heterodyne detection technique is demonstrated for real-time, cross-sectional imaging using optical coherence domain reflectometry without lateral scanning. The present technique, which is based on a frequency synchronous detection scheme, enables parallel heterodyne detection with an imager such as a charge coupled device camera. Full-field, micrometer-scale, depth-resolved images acquired at a rate of 10 frame/s are presented.

引用

页码：L1194 / L1196

页数：3

共 9 条

[1]

AKIBA M, 2000, P C LAS EL CLEO EUR, P22

[2] Full-field optical coherence microscopy [J].