Bridging the gap between conventional and video-speed scanning probe microscopes

被引:90
作者
Fleming, A. J. [1 ]
Kenton, B. J. [2 ]
Leang, K. K. [2 ]
机构
[1] Univ Newcastle, Sch Elect Engn & Comp Sci, Callaghan, NSW 2308, Australia
[2] Univ Nevada Reno, Dept Mech Engn, Reno, NV 89557 USA
基金
澳大利亚研究理事会;
关键词
Tip scanning instrument design and characterization; Scanning tunneling microscopy (STM); Atomic force microscopy (AFM); ATOMIC-FORCE MICROSCOPY; DESIGN; AFM;
D O I
10.1016/j.ultramic.2010.04.016
中图分类号
TH742 [显微镜];
学科分类号
摘要
A major disadvantage of scanning probe microscopy is the slow speed of image acquisition, typically less than one image per minute. This paper describes three techniques that can be used to increase the speed of a conventional scanning probe microscope by greater than one hundred times. This is achieved by the combination of high-speed vertical positioning, sinusoidal scanning, and high-speed image acquisition. These techniques are simple, low-cost, and can be applied to many conventional microscopes without significant modification. Experimental results demonstrate an increased scan rate from 1 to 200 Hz. This reduces the acquisition time for a 200 x 200 resolution image from 3 min to 1 s. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:1205 / 1214
页数:10
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