Deducing structural variations of the apex of probes used in near-field optical microscopy through simultaneous measurement of shear force and evanescent intensity

被引：4

作者：

Maheswari, RU ^{[1
]}

Mononobe, S ^{[1
]}

Ohtsu, M ^{[1
]}

机构：

[1] TOKYO INST TECHNOL,INTERDISCIPLINARY GRAD SCH SCI & ENGN,MIDORI KU,YOKOHAMA,KANAGAWA 226,JAPAN

来源：

APPLIED OPTICS | 1996年 / 35卷 / 34期

关键词：

near-field optical microscopy; shear force; evanescent intensity; simultaneous detection; near-field optical morphology of probe;

D O I：

10.1364/AO.35.006740

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We propose a simple method employing the simultaneous detection of evanescent intensity and shear force to deduce variations in the near-field optical morphology of the apex of the probes used in near-field microscopy. Fabrication of our probes involves sharpening by chemical etching, metal coating, and removal of metal from the apex. We show that through the simultaneous measurement of shear force and evanescent intensity, it is possible to detect variations in the optical morphology of the very apex of the probes during near-field imaging by a scanning near-field optical microscope. (C) 1996 Optical Society of America

引用

页码：6740 / 6743

页数：4

共 18 条

[1] NEAR-FIELD OPTICS - MICROSCOPY, SPECTROSCOPY, AND SURFACE MODIFICATION BEYOND THE DIFFRACTION LIMIT [J].

BETZIG, E ;

TRAUTMAN, JK .

SCIENCE, 1992, 257 (5067) :189-195

[2] COMBINED SHEAR FORCE AND NEAR-FIELD SCANNING OPTICAL MICROSCOPY [J].

BETZIG, E ;

FINN, PL ;

WEINER, JS .

APPLIED PHYSICS LETTERS, 1992, 60 (20) :2484-2486

[3] NEAR-FIELD MAGNETOOPTICS AND HIGH-DENSITY DATA-STORAGE [J].

BETZIG, E ;

TRAUTMAN, JK ;

WOLFE, R ;

GYORGY, EM ;

FINN, PL ;

KRYDER, MH ;

CHANG, CH .

APPLIED PHYSICS LETTERS, 1992, 61 (02) :142-144

[4] OPTICAL SPECTROSCOPY OF A GAAS/ALGAAS QUANTUM-WIRE STRUCTURE USING NEAR-FIELD SCANNING OPTICAL MICROSCOPY [J].

GROBER, RD ;

HARRIS, TD ;

TRAUTMAN, JK ;

BETZIG, E ;

WEGSCHEIDER, W ;

PFEIFFER, L ;

WEST, K .

APPLIED PHYSICS LETTERS, 1994, 64 (11) :1421-1423

[5]

JANG K, 1996, OPT LETT, V21, P1

[6] HIGHLY LOCALIZED PHOTOCHEMICAL PROCESSES IN LB FILMS OF PHOTO CHROMIC MATERIAL BY USING A PHOTON SCANNING TUNNELING MICROSCOPE [J].

JIANG, SD ;

ICHIHASHI, J ;

MONOBE, H ;

FUJIHIRA, M ;

OHTSU, M .

OPTICS COMMUNICATIONS, 1994, 106 (4-6) :173-177

[7] ORIGINS AND EFFECTS OF THERMAL-PROCESSES ON NEAR-FIELD OPTICAL PROBES [J].

LAROSA, AH ;

YAKOBSON, BI ;

HALLEN, HD .

APPLIED PHYSICS LETTERS, 1995, 67 (18) :2597-2599

[8]

MAHESWARI RU, 1995, OPT COMMUN, V120, P325, DOI 10.1016/0030-4018(95)00462-H

[9]

MAHESWARI RU, 1996, OPT REV, V3

[10]

MONOBE S, 1995, P C NEAR FIELD OPTIC, V8, P105

← 1 2 →