Charge density and film morphology dependence of charge mobility in polymer field-effect transistors

被引:68
作者
Shaked, S
Tal, S
Roichman, Y
Razin, A
Xiao, S
Eichen, Y
Tessler, N [1 ]
机构
[1] Technion Israel Inst Technol, Dept Elect Engn, Ctr Microelect, IL-32000 Haifa, Israel
[2] Technion Israel Inst Technol, Dept Chem, IL-32000 Haifa, Israel
[3] Amer Dye Source Inc, Baie Durfe, PQ H9X 3T6, Canada
关键词
D O I
10.1002/adma.200304653
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
A qualitative comparison between the extended disorder model for charge transport and the measured charge density dependence of the field-effect mobility is presented for field-effect transistors (see Figure) using a poly(phenylenevinylene) layer. By varying the film morphology through the use of polymers of different molecular weights, further insight into the role of morphology is gained.
引用
收藏
页码:913 / +
页数:5
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