Evaluation of densities and mobilities for heavy and light holes in p-type Hg1-xCdx molecular beam epitaxy films from magnetic-field-dependent Hall data

被引:14
作者
Gui, YS [1 ]
Li, BA [1 ]
Zheng, GZ [1 ]
Chang, Y [1 ]
Wang, SL [1 ]
He, L [1 ]
Chu, JH [1 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Tech Phys, Natl Lab Infrared Phys, Shanghai 200083, Peoples R China
关键词
D O I
10.1063/1.368652
中图分类号
O59 [应用物理学];
学科分类号
摘要
The densities and mobilities of heavy and light holes have been simultaneously determined at various temperatures (1.2-300 K) in two molecular beam epitaxy- grown p-type Hg1-xCdxTe (x = 0.224) samples from variable magnetic-field Hall measurements. The separation of the contribution from the light hole and heavy hole was achieved by a hybrid approach consisting of mobility spectrum analysis followed by a multicarrier fitting procedure. An acceptor energy level at similar to 13 meV above the valence band, as well as various mass ratios of light to heavy holes for different temperature were obtained. In addition, the minority carrier (electron) and the surface two-dimensional electron concentrations and mobilities have also been derived as a function of temperature. The explicit experimental values obtained in this work should be useful to physics and modeling of HgCdTe infrared detectors. (C) 1998 American Institute of Physics. [S0021-8979(98)03119-3].
引用
收藏
页码:4327 / 4331
页数:5
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