Bifurcations from locally to globally riddled basins

被引:32
作者
Kapitaniak, T [1 ]
Maistrenko, Y
Stefanski, A
Brindley, J
机构
[1] Univ Maryland, Inst Plasma Res, College Pk, MD 20742 USA
[2] Lodz Tech Univ, Div Dynam, PL-90924 Lodz, Poland
[3] Ukrainian Acad Sci, Inst Math, UA-252601 Kiev, Ukraine
[4] Univ Leeds, Dept Appl Math Studies, Leeds LS2 9JT, W Yorkshire, England
来源
PHYSICAL REVIEW E | 1998年 / 57卷 / 06期
关键词
D O I
10.1103/PhysRevE.57.R6253
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
We give sufficient conditions for the occurrence of locally and globally riddled basins in coupled systems. Two different types of bifurcations from locally to globally riddled basins are described.
引用
收藏
页码:R6253 / R6256
页数:4
相关论文
共 34 条
[1]   RIDDLED BASINS [J].
Alexander, J. C. ;
Yorke, James A. ;
You, Zhiping ;
Kan, I. .
INTERNATIONAL JOURNAL OF BIFURCATION AND CHAOS, 1992, 2 (04) :795-813
[2]  
ANISHCHENKO VS, 1991, RADIOTEKH ELEKTRON+, V36, P338
[3]   BUBBLING OF ATTRACTORS AND SYNCHRONIZATION OF CHAOTIC OSCILLATORS [J].
ASHWIN, P ;
BUESCU, J ;
STEWART, I .
PHYSICS LETTERS A, 1994, 193 (02) :126-139
[4]   Loss of chaos synchronization through the sequence of bifurcations of saddle periodic orbits [J].
Astakhov, V ;
Shabunin, A ;
Kapitaniak, T ;
Anishchenko, V .
PHYSICAL REVIEW LETTERS, 1997, 79 (06) :1014-1017
[5]   SYNCHRONIZING CHAOTIC CIRCUITS [J].
CARROLL, TL ;
PECORA, LM .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1991, 38 (04) :453-456
[6]   CIRCUIT IMPLEMENTATION OF SYNCHRONIZED CHAOS WITH APPLICATIONS TO COMMUNICATIONS [J].
CUOMO, KM ;
OPPENHEIM, AV .
PHYSICAL REVIEW LETTERS, 1993, 71 (01) :65-68
[7]  
DEMELO W, 1993, ONE DIMENSIONAL DYNA
[8]  
DESOUSA M, 1992, PHYS REV A, V46, P7359
[9]   SYNCHRONIZING CHAOS FROM ELECTRONIC PHASE-LOCKED LOOPS [J].
Endo, Tetsuro ;
Chua, Leon O. .
INTERNATIONAL JOURNAL OF BIFURCATION AND CHAOS, 1991, 1 (03) :701-710
[10]   EXPERIMENTAL AND NUMERICAL EVIDENCE FOR RIDDLED BASINS IN COUPLED CHAOTIC SYSTEMS [J].
HEAGY, JF ;
CARROLL, TL ;
PECORA, LM .
PHYSICAL REVIEW LETTERS, 1994, 73 (26) :3528-3531