Frequency properties of 4H-SiC thyristors at high current density

被引:9
作者
Levinshtein, ME
Palmour, JW
Rumyantsev, SL
Singh, R
机构
[1] AF Ioffe Phys Tech Inst, St Petersburg 194021, Russia
[2] CREE Res Inst, Durham, NC 27713 USA
关键词
D O I
10.1088/0268-1242/14/2/016
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Frequency properties of 4H-SiC thyristors with forward blocking voltages of similar to 400 V and similar to 700 V have been investigated. The limiting operating frequency exceeds 500 kHz up to current densities of j congruent to 14000 A cm(-2) for 400 V structures and 750 A cm(-2) for 700 V structures. The experimentally measured limiting frequencies of 4H-SiC devices are compared with the theoretical estimations and the experimental data for rated Si thyristors.
引用
收藏
页码:207 / 209
页数:3
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