Higher order nonlinear dielectric imaging using scanning nonlinear dielectric microscopy

被引：12

作者：

Cho, Y ^{[1
]}

Ohara, K ^{[1
]}

机构：

[1] Tohoku Univ, Elect Commun Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2001年 / 40卷 / 6B期

关键词：

scanning nonlinear dielectric microscopy; nonlinear dielectric constant; scanning probe microscopy; surface layer observation;

D O I：

10.1143/JJAP.40.4349

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The higher order nonlinear dielectric imaging technique using scanning nonlinear dielectric microscopy (SNDM) is investigated. The resolution of the higher order nonlinear dielectric imaging is much higher than that of the conventional nonlinear dielectric imaging which detects the lowest order of the nonlinear dielectric constant. It is demonstrated that this higher order imaging is very useful for observing a surface layer with a unit cell scale thickness formed on ferroelectric material.

引用

页码：4349 / 4353

页数：5

共 6 条

[1] Scanning nonlinear dielectric microscopy with nanometer resolution [J].

Cho, Y ;

Kazuta, S ;

Matsuura, K .

APPLIED PHYSICS LETTERS, 1999, 75 (18) :2833-2835

[2] Scanning nonlinear dielectric microscope using a lumped constant resonator probe and its application to investigation of ferroelectric polarization distributions [J].

Cho, Y ;

Atsumi, S ;

Nakamura, K .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1997, 36 (5B) :3152-3156

[3]

Cho Y., 1995, Transactions of the Institute of Electronics, Information and Communication Engineers C-I, VJ78C-I, P593

[4] Quantitative measurement of linear and nonlinear dielectric characteristics using scanning nonlinear dielectric microscopy [J].

Cho, YS ;

Kazuta, S ;

Ohara, K ;

Odagawa, H .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (5B) :3086-3089

[5] Simultaneous observation of ferroelectric domain patterns by scanning nonlinear dielectric microscope and surface morphology by atomic force microscope [J].

Odagawa, H ;

Cho, Y ;

Funakubo, H ;

Nagashima, K .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (6B) :3808-3810

[6] Simultaneous observation of nano-sized ferroelectric domains and surface morphology using scanning nonlinear dielectric microscopy [J].

Odagawa, H ;

Cho, Y .

SURFACE SCIENCE, 2000, 463 (01) :L621-L625

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