Molecular beam epitaxy growth kinetics for group III nitrides

被引:9
作者
Foxon, CT
Cheng, TS
Hooper, SE
Jenkins, LC
Orton, JW
Lacklison, DE
Novikov, SV
Popova, TB
Tretyakov, VV
机构
[1] UNIV NOTTINGHAM,DEPT ELECT & ELECTR ENGN,NOTTINGHAM NG7 2RD,ENGLAND
[2] AF IOFFE PHYS TECH INST,ST PETERSBURG 194021,RUSSIA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1996年 / 14卷 / 03期
关键词
D O I
10.1116/1.588857
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have used a modified molecular beam epitaxy method, in which the active species of nitrogen is derived from an Oxford applied research rf activated plasma source, to grow AlN, GaN, InN, Al(AsN) and Ga(AsN). In this paper we discuss, for the first time, the growth kinetics of both binary nitrides and ''ternary alloys'' in the light of both our observations and those of other groups working in this area and their relevance to the properties of films grown under various conditions. (C) 1996 American Vacuum Society.
引用
收藏
页码:2346 / 2348
页数:3
相关论文
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