Semianalytic model of electron pulse propagation: Magnetic lenses and rf pulse compression cavities

被引:11
作者
Berger, Joel A. [1 ]
Schroeder, W. Andreas [1 ]
机构
[1] Univ Illinois, Dept Phys, Chicago, IL 60607 USA
基金
美国国家科学基金会;
关键词
GUN; DIFFRACTION;
D O I
10.1063/1.3512847
中图分类号
O59 [应用物理学];
学科分类号
摘要
The analytical Gaussian electron pulse propagation model of Michalik and Sipe [J. Appl. Phys. 99, 054908 (2006)] is extended to include the action of external forces on the pulse. The resultant ability to simulate efficiently the effect of electron optical elements (e.g., magnetic lenses and radio-frequency cavities) allows for the rapid assessment of electron pulse delivery systems in time-resolved ultrafast electron diffraction and microscopy experiments. (C) 2010 American Institute of Physics. [doi:10.1063/1.3512847]
引用
收藏
页数:12
相关论文
共 35 条
[1]   Prospects for electron imaging with ultrafast time resolution [J].
Armstrong, Michael R. ;
Reed, Bryan W. ;
Torralva, Ben R. ;
Browning, Nigel D. .
APPLIED PHYSICS LETTERS, 2007, 90 (11)
[2]   Practical considerations for high spatial and temporal resolution dynamic transmission electron microscopy [J].
Armstrong, Michael R. ;
Boyden, Ken ;
Browning, Nigel D. ;
Campbell, Geoffrey H. ;
Colvin, Jeffrey D. ;
DeHope, William J. ;
Frank, Alan M. ;
Gibson, David J. ;
Hartemann, Fred ;
Kim, Judy S. ;
King, Wayne E. ;
LaGrange, Thomas B. ;
Pyke, Ben J. ;
Reed, Bryan W. ;
Shuttlesworth, Richard M. ;
Stuart, Brent C. ;
Torralva, Ben R. .
ULTRAMICROSCOPY, 2007, 107 (4-5) :356-367
[3]   DC Photoelectron Gun Parameters for Ultrafast Electron Microscopy [J].
Berger, Joel A. ;
Hogan, John T. ;
Greco, Michael J. ;
Schroeder, W. Andreas ;
Nicholls, Alan W. ;
Browning, Nigel D. .
MICROSCOPY AND MICROANALYSIS, 2009, 15 (04) :298-313
[4]   TRACING FAST PHASE-TRANSITIONS BY ELECTRON-MICROSCOPY [J].
BOSTANJOGLO, O ;
LIEDTKE, R .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1980, 60 (02) :451-455
[5]   Femtosecond electron diffraction for direct measurement of ultrafast atomic motions [J].
Cao, J ;
Hao, Z ;
Park, H ;
Tao, C ;
Kau, D ;
Blaszczyk, L .
APPLIED PHYSICS LETTERS, 2003, 83 (05) :1044-1046
[6]   High-speed transmission electron microscope [J].
Dömer, H ;
Bostanjoglo, O .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2003, 74 (10) :4369-4372
[7]  
El-Kareh A.B., 1970, Electron beams, lenses, and optics, V1
[8]   Sub-fs electron pulses for ultrafast electron diffraction [J].
Fill, Ernst ;
Veisz, Laszlo ;
Apolonski, Alexander ;
Krausz, Ferenc .
NEW JOURNAL OF PHYSICS, 2006, 8
[9]  
Humphries S., 1986, PRINCIPLES CHARGED P
[10]   Theoretical model of the intrinsic emittance of a photocathode [J].
Jensen, Kevin L. ;
O'Shea, P. G. ;
Feldman, D. W. ;
Moody, N. A. .
APPLIED PHYSICS LETTERS, 2006, 89 (22)