Kelvin probe force microscopy imaging using carbon nanotube probe

被引：17

作者：

Takahashi, S ^{[1
]}

Kishida, T ^{[1
]}

Akita, S ^{[1
]}

Nakayama, Y ^{[1
]}

机构：

[1] Univ Osaka Prefecture, Dept Phys & Elect, Sakai, Osaka 5998531, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2001年 / 40卷 / 6B期

关键词：

carbon nanotube; KFM; nanotube probe; work function;

D O I：

10.1143/JJAP.40.4314

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have measured the potential profiles of the contact potential difference (CPD) between Al-evaporated substrates and dispersed carbon nanotubes (CNTs) by Kelvin probe force microscopy (KFM) using both a conventional Au-coated Si (Au-Si) probe and a CNT probe. The lateral resolutions of both topography and the potential distribution image were improved by using the CNT probe. The CPD has been measured for CNTs with various diameters. We observed that the CPD increases with an increase in the diameter. This indicates that the work function of CNTs increases with an increase in the diameter.

引用

页码：4314 / 4316

页数：3

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