Characterisation of multiple carrier transport in indium nitride grown by molecular beam epitaxy

被引:13
作者
Fehlberg, Tamara B. [1 ]
Umana-Membreno, Gilberto A. [1 ]
Gallinat, Chad S. [2 ]
Koblmueller, Gregor [2 ]
Bernardis, Sarah [2 ]
Nener, Brett D. [1 ]
Parish, Giacinta [1 ]
Speck, James S. [2 ]
机构
[1] Univ Western Australia, Sch Elect Elect & Comp Engn, Crawley, WA 6009, Australia
[2] Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA
来源
PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 4 NO 7 2007 | 2007年 / 4卷 / 07期
基金
澳大利亚研究理事会;
关键词
D O I
10.1002/pssc.200674780
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Quantitative mobility spectrum analysis (QMSA) was performed on multiple magnetic field Hall effect measurements of indium nitride grown by molecular beam epitaxy. This enables two clearly distinct electron species to be identified, which are attributed to the bulk and a surface accumulation layer. In this material, single magnetic field data corresponds to neither electron species, as both contribute significantly to the total conduction. The bulk electron distribution has an extracted average Hall mobility of 3570 cm(2)/(Vs) at 300 K with a concentration of 1.5 x 1017 cm(-3), while the surface electrons have sheet charge density that is an order of magnitude higher than previously reported surface concentrations. The high quality bulk characteristics revealed emphasise the importance of using multi-carrier analysis when performing transport measurements on InN.
引用
收藏
页码:2423 / +
页数:3
相关论文
共 9 条
[1]   ELECTRON MOBILITIES IN GALLIUM, INDIUM, AND ALUMINUM NITRIDES [J].
CHIN, VWL ;
TANSLEY, TL ;
OSTOCHAN, T .
JOURNAL OF APPLIED PHYSICS, 1994, 75 (11) :7365-7372
[2]  
GALLINAT CS, 2006, APPL PHYS LETT, V89
[3]   Evidence for p-type doping of InN [J].
Jones, RE ;
Yu, KM ;
Li, SX ;
Walukiewicz, W ;
Ager, JW ;
Haller, EE ;
Lu, H ;
Schaff, WJ .
PHYSICAL REVIEW LETTERS, 2006, 96 (12)
[4]   Optimization of the surface and structural quality of N-face InN grown by molecular beam epitaxy [J].
Koblmuller, G. ;
Gallinat, C. S. ;
Bernardis, S. ;
Speck, J. S. ;
Chern, G. D. ;
Readinger, E. D. ;
Shen, H. ;
Wraback, M. .
APPLIED PHYSICS LETTERS, 2006, 89 (07)
[5]   Surface charge accumulation of InN films grown by molecular-beam epitaxy [J].
Lu, H ;
Schaff, WJ ;
Eastman, LF ;
Stutz, CE .
APPLIED PHYSICS LETTERS, 2003, 82 (11) :1736-1738
[6]   Effect of an AlN buffer layer on the epitaxial growth of InN by molecular-beam epitaxy [J].
Lu, H ;
Schaff, WJ ;
Hwang, J ;
Wu, H ;
Koley, G ;
Eastman, LF .
APPLIED PHYSICS LETTERS, 2001, 79 (10) :1489-1491
[7]   Low-field electron mobility in wurtzite InN [J].
Polyakov, VM ;
Schwierz, F .
APPLIED PHYSICS LETTERS, 2006, 88 (03) :1-3
[8]   Investigation of multiple carrier effects in InN epilayers using variable magnetic field Hall measurements [J].
Swartz, CH ;
Tompkins, RP ;
Giles, NC ;
Myers, TH ;
Lu, H ;
Schaff, WJ ;
Eastman, LF .
JOURNAL OF CRYSTAL GROWTH, 2004, 269 (01) :29-34
[9]   Improved quantitative mobility spectrum analysis for Hall characterization [J].
Vurgaftman, I ;
Meyer, JR ;
Hoffman, CA ;
Redfern, D ;
Antoszewski, J ;
Faraone, L ;
Lindemuth, JR .
JOURNAL OF APPLIED PHYSICS, 1998, 84 (09) :4966-4973