Evidence for p-type doping of InN

被引:192
作者
Jones, RE [1 ]
Yu, KM
Li, SX
Walukiewicz, W
Ager, JW
Haller, EE
Lu, H
Schaff, WJ
机构
[1] Lawrence Berkeley Natl Lab, Div Mat Sci, Berkeley, CA 94720 USA
[2] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA
[3] Cornell Univ, Dept Elect & Comp Engn, Ithaca, NY 14853 USA
关键词
D O I
10.1103/PhysRevLett.96.125505
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The first evidence of successful p-type doping of InN is presented. It is shown that InNMg films consist of a p-type bulk region with a thin n-type inversion layer at the surface that prevents electrical contact to the bulk. Capacitance-voltage measurements indicate a net concentration of ionized acceptors below the n-type surface. Irradiation with 2 MeV He+ ions is used to convert the bulk of InNMg from p to n-type, at which point photoluminescence is recovered. The conversion is well explained by a model assuming two parallel conducting layers (the surface and the bulk) in the films.
引用
收藏
页数:4
相关论文
共 15 条
  • [1] Davydov VY, 2002, PHYS STATUS SOLIDI B, V229, pR1, DOI 10.1002/1521-3951(200202)229:3<R1::AID-PSSB99991>3.0.CO
  • [2] 2-O
  • [3] Band structures and optical spectra of InN polymorphs:: Influence of quasiparticle and excitonic effects -: art. no. 205106
    Furthmüller, J
    Hahn, PH
    Fuchs, F
    Bechstedt, F
    [J]. PHYSICAL REVIEW B, 2005, 72 (20)
  • [4] Electrochemical capacitance voltage profiling of the narrow band gap semiconductor InAs
    Gopal, V
    Chen, EH
    Kvam, EP
    Woodall, JM
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2000, 29 (11) : 1333 - 1339
  • [5] Optical properties of Si-doped InN grown on sapphire (0001)
    Inushima, T
    Higashiwaki, M
    Matsui, T
    [J]. PHYSICAL REVIEW B, 2003, 68 (23)
  • [6] Native-defect-controlled n-type conductivity in InN
    Jones, RE
    Li, SX
    Hsu, L
    Yu, KM
    Walukiewicz, W
    Lillental-Weber, Z
    Ager, JW
    Haller, EE
    Lu, H
    Schaff, WJ
    [J]. PHYSICA B-CONDENSED MATTER, 2006, 376 : 436 - 439
  • [7] Fermi-level stabilization energy in group III nitrides
    Li, SX
    Yu, KM
    Wu, J
    Jones, RE
    Walukiewicz, W
    Ager, JW
    Shan, W
    Haller, EE
    Lu, H
    Schaff, WJ
    [J]. PHYSICAL REVIEW B, 2005, 71 (16)
  • [8] Improvement on epitaxial grown of InN by migration enhanced epitaxy
    Lu, H
    Schaff, WJ
    Hwang, J
    Wu, H
    Yeo, W
    Pharkya, A
    Eastman, LF
    [J]. APPLIED PHYSICS LETTERS, 2000, 77 (16) : 2548 - 2550
  • [9] Surface charge accumulation of InN films grown by molecular-beam epitaxy
    Lu, H
    Schaff, WJ
    Eastman, LF
    Stutz, CE
    [J]. APPLIED PHYSICS LETTERS, 2003, 82 (11) : 1736 - 1738
  • [10] Intrinsic electron accumulation at clean InN surfaces
    Mahboob, I
    Veal, TD
    McConville, CF
    Lu, H
    Schaff, WJ
    [J]. PHYSICAL REVIEW LETTERS, 2004, 92 (03) : 4