Native-defect-controlled n-type conductivity in InN

被引:26
作者
Jones, RE
Li, SX
Hsu, L
Yu, KM
Walukiewicz, W
Lillental-Weber, Z
Ager, JW
Haller, EE
Lu, H
Schaff, WJ
机构
[1] Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
[2] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA
[3] Univ Minnesota, Gen Coll, Minneapolis, MN 55455 USA
[4] Cornell Univ, Dept Elect & Comp Engn, Ithaca, NY 14853 USA
关键词
InN; radiation; native defects; mobility;
D O I
10.1016/j.physb.2005.12.112
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
High-energy particle irradiation has been shown previously to be a method for n-type doping of InN. Here we irradiated InN with H+ and He+ particles to study the dependence of the electron mobility on electron concentrations varying from mid-10(18) to mid-10(20) cm(-3). We find that the electron mobility is limited by scattering from the ionized defects created by irradiation, resulting in a strong correlation between mobility and electron concentration. Furthermore, our calculations suggest that the radiation-induced defects may be triply charged donors. (c) 2005 Published by Elsevier B.V.
引用
收藏
页码:436 / 439
页数:4
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