共 28 条
[1]
Direct determination of exact charge states of surface point defects using scanning tunneling microscopy: As vacancies on GaAs (110)
[J].
PHYSICAL REVIEW B,
1996, 53 (11)
:6935-6938
[3]
Microscopic identification of the compensation mechanisms in Si-doped GaAs
[J].
PHYSICAL REVIEW B,
1996, 54 (15)
:10288-10291
[4]
Temperature dependent compensation of Zn-dopant atoms by vacancies in III-V semiconductor surfaces
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A,
1996, 14 (03)
:1807-1811
[7]
Thermal formation of Zn-dopant-vacancy defect complexes on InP(110) surfaces
[J].
PHYSICAL REVIEW B,
1996, 53 (08)
:4580-4590
[8]
FORMATION OF ANION VACANCIES BY LANGMUIR EVAPORATION FROM INP(110) AND GAAS(110) SURFACES AT LOW-TEMPERATURES
[J].
PHYSICAL REVIEW B,
1995, 51 (15)
:9696-9701