Nature of native oxide on GaN surface and its reaction with Al

被引:141
作者
Prabhakaran, K
Andersson, TG
Nozawa, K
机构
[1] CHALMERS UNIV TECHNOL, DEPT PHYS, S-41296 GOTHENBURG, SWEDEN
[2] UNIV GOTHENBURG, S-41296 GOTHENBURG, SWEDEN
关键词
D O I
10.1063/1.117964
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this letter, we describe the surface properties of GaN thin films grown on sapphire substrate by molecular beam epitaxy, as revealed by ultraviolet and x-ray photoelectron spectroscopic and Auger electron spectroscopic studies. The samples are seen to contain overlayer of native oxides, which are predominantly in the Ga2O3 form. Ammonia is shown to be a good etchant for these native oxides. Furthermore, we investigated the early stages of the reaction of monolayer Al with a GaN surface covered with native oxide, Aluminum reacts preferentially with the surface oxygen and leads to the formation of a mixture of oxides at the interface. (C) 1996 American institute of Physics.
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页码:3212 / 3214
页数:3
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