Spectroscopic THz near-field microscope

被引：127

作者：

von Ribbeck, H. -G. ^{[1
,2
]}

Brehm, M. ^{[1
,2
]}

van der Weide, D. W. ^{[3
]}

Winnerl, S. ^{[4
]}

Drachenko, O. ^{[4
]}

Helm, M. ^{[4
]}

Keilmann, F. ^{[1
,2
]}

机构：

[1] Max Planck Inst Biochem, D-82152 Martinsried, Germany

[2] Ctr Nanosci, D-82152 Martinsried, Germany

[3] Univ Wisconsin, Dept Elect & Comp Engn, Madison, WI 53706 USA

[4] Forschungzentrum Dresden Rossendorf, D-01314 Dresden, Germany

来源：

OPTICS EXPRESS | 2008年 / 16卷 / 05期

关键词：

D O I：

10.1364/OE.16.003430

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We demonstrate a scattering-type scanning near-field optical microscope (s-SNOM) with broadband THz illumination. A cantilevered W tip is used in tapping AFM mode. The direct scattering spectrum is obtained and optimized by asynchronous optical sampling (ASOPS), while near-field scattering is observed by using a space-domain delay stage and harmonic demodulation of the detector signal. True near-field interaction is determined from the approach behavior of the tip to Au samples. Scattering spectra of differently doped Si are presented. (C) 2008 Optical Society of America.

引用

页码：3430 / 3438

页数：9

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