Microwave CMOS - Device physics and design

被引:127
作者
Manku, T [1 ]
机构
[1] Univ Waterloo, Dept Elect & Comp Engn, Ctr Wireless Commun, RF Technol Grp, Waterloo, ON N2L 3G1, Canada
关键词
CMOS; microwave CMOS; radio frequency; RF MOSFET design;
D O I
10.1109/4.748178
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper discusses design issues and the microwave properties of CMOS devices. A qualitative understanding of the microwave characteristics of MOS transistors is provided. The paper is directed toward helping analog IC circuit designers create better front-end radio-frequency CMOS circuits. The network properties of CMOS devices, the frequency response, and the microwave noise properties are reviewed, and a summary of the microwave scaling rules are presented.
引用
收藏
页码:277 / 285
页数:9
相关论文
共 31 条
[1]   LOW-POWER RADIOFREQUENCY ICS FOR PORTABLE COMMUNICATIONS [J].
ABIDI, AA .
PROCEEDINGS OF THE IEEE, 1995, 83 (04) :544-569
[2]   HIGH-FREQUENCY NOISE MEASUREMENTS ON FETS WITH SMALL DIMENSIONS [J].
ABIDI, AA .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1986, 33 (11) :1801-1805
[3]   A small-signal MOSFET model for radio frequency IC applications [J].
AbouAllam, E ;
Manku, T .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1997, 16 (05) :437-447
[4]  
BOHERI M, 1985, IEEE T ELECTRON DEV, V32, P2383
[5]  
Chen CH, 1997, NOISE IN PHYSICAL SYSTEMS AND 1/F FLUCTUATIONS, PROCEEDINGS OF THE 14TH INTERNATIONAL CONFERENCE, P488
[6]   A single-chip 900 MHz CMOS receiver front-end with a high performance low-IF topology [J].
Crols, J ;
Steyaert, MSJ .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1995, 30 (12) :1483-1492
[7]   HIGH-FREQUENCY NETWORK PROPERTIES OF MOS TRANSISTORS INCLUDING SUBSTRATE RESISTIVITY EFFECTS [J].
DAS, MB .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1969, ED16 (12) :1049-+
[8]   OPTIMAL NOISE-FIGURE OF MICROWAVE GAAS-MESFETS [J].
FUKUI, H .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (07) :1032-1037
[9]  
Golio J. M., 1991, MICROWAVE MESFETS HE
[10]   The impact of scaling down to deep submicron on CMOS RF circuits [J].
Huang, QT ;
Piazza, F ;
Orsatti, P ;
Ohguro, T .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1998, 33 (07) :1023-1036