Metastable phase of Si(110) surface: 5 x 8 reconstruction

被引:10
作者
Ohira, Yutaka [1 ]
Yoshimura, Masamichi [1 ]
Ueda, Kazuyuki [1 ]
机构
[1] Toyota Technol Inst, Nano Hightech Res Ctr, Grad Sch Engn, Tempaku Ku, Nagoya, Aichi 4688511, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2007年 / 46卷 / 8B期
关键词
Si(110); STM; LEED; reconstruction; metastable phase; SCANNING-TUNNELING-MICROSCOPY; CLEAN GE(110) SURFACE; SILICON; GERMANIUM; RHEED; TRANSITIONS; NICKEL; 16X2; LEED;
D O I
10.1143/JJAP.46.5652
中图分类号
O59 [应用物理学];
学科分类号
摘要
A new type of surface phase in Si(I 10) has been discovered and analyzed by scanning tunneling microscopy (STM) and low-energy electron diffraction (LEED). When the Si(110) surface is flashed at 1200 degrees C followed by annealing at 330 degrees C for 1 h, a superstructure with two equivalent domains forms. From STM and LEED analysis, the structure is revealed to be a 5 x 8, superstructure. On the basis of high-resolution STM images, a possible structural model of the 5 x 8 structure is proposed. Moreover, since this structure eventually returns to the clean "16 x 2" structure by prolonged annealing at. the same temperature, the 5 x 8 structure is believed to be a metastable phase of a clean Si(110) surface.
引用
收藏
页码:5652 / 5654
页数:3
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