Dislocation-free GaAsyP1-x-yNx/GaP0.98N0.02 quantum-well structure lattice-matched to a Si substrate

被引:44
作者
Fujimoto, Y [1 ]
Yonezu, H [1 ]
Utsumi, A [1 ]
Momose, K [1 ]
Furukawa, Y [1 ]
机构
[1] Toyohashi Univ Technol, Dept Elect & Elect Engn, Aichi 4418580, Japan
关键词
D O I
10.1063/1.1395519
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report that a lattice-matched and dislocation-free GaAsyP1-x-yNx/GaP0.98N0.02 quantum-well (QW) structure can be grown on a Si substrate. A two-dimensional growth mode was maintained during growth of all the layers. It was confirmed that the QW structure was lattice-matched to the Si substrate from the lattice constant measured by x-ray diffraction. A cross-sectional image taken by transmission electron microscopy revealed that no threading dislocations or misfit dislocations were observed at the QW structure. (C) 2001 American Institute of Physics.
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页码:1306 / 1308
页数:3
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