Millimeter wave emission from GaN high electron mobility transistor

被引:73
作者
Deng, YQ
Kersting, R
Xu, JZ
Ascazubi, R
Zhang, XC
Shur, MS
Gaska, R
Simin, GS
Khan, MA
Ryzhii, V
机构
[1] Rensselaer Polytech Inst, Dept Elect Comp & Syst Engn, Troy, NY 12180 USA
[2] Rensselaer Polytech Inst, RPI IBM Ctr Broadband Data Transfer, Troy, NY 12180 USA
[3] Rensselaer Polytech Inst, Dept Phys Appl Phys & Astron, Sci Ctr 1C25, Troy, NY 12180 USA
[4] Sensor Elect Technol Inc, Columbia, SC 29209 USA
[5] Univ S Carolina, Dept Elect & Comp Engn, Columbia, SC 29208 USA
[6] Univ Aizu, Comp Solid State Phys Lab, Aizu Wakamatsu 9658580, Japan
关键词
D O I
10.1063/1.1638625
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on millimeter wave electromagnetic radiation from a GaN high electron mobility transistor with the gate length of 1.5 mum at 8 K. The emission takes place at gate and drain voltages in the linear regime of operation but close to the saturation voltage with the principal emission peak at approximately 75 GHz, which is much higher than the device cut-off frequency. An explanation of this effect involves the "shallow water" plasma wave instability, with the frequency of the plasma waves decreased by the ungated regions of the device. (C) 2004 American Institute of Physics.
引用
收藏
页码:70 / 72
页数:3
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