Surface phases analysis by grazing incidence of X-rays in a Bragg-Brentano diffractometer

被引：8

作者：

Battaglia, S

机构：

[1] Inst. of Geothermal Research C.N.R, 56126 Pisa

来源：

APPLIED SURFACE SCIENCE | 1996年 / 93卷 / 04期

关键词：

D O I：

10.1016/0169-4332(95)00344-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A technique which utilizes an unmodified commercial Bragg-Brentano X-ray diffractometer, for the study of thin surface layers is presented. The considered diffractometer setup permits data acquisition with Theta fixed at 1 degrees and 2 Theta scanning the Bragg line. The results obtained with this technique are shown for some examples regarding the study of surface or near surface interfaces.

引用

页码：349 / 352

页数：4

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