Improved ferroelectric and pyroelectric properties in Mn-doped lead zirconate titanate thin films

被引:114
作者
Zhang, Q [1 ]
Whatmore, RW [1 ]
机构
[1] Cranfield Univ, SIMS, Dept Adv Mat, Cranfield MK43 0AL, Beds, England
关键词
D O I
10.1063/1.1613370
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have investigated the effects of Mn doping on the ferroelectric and pyroelectric properties of Pb(Zr0.3Ti0.7)O-3 (PZT) thin films on substrates Pt/Ti/SiO2/Si. The Mn-doped (1 mol %) PZT (PMZT) showed almost no hysteretic fatigue up to 10(10) switching bipolar pulse cycles, coupled with excellent retention properties. We present evidence that while a low permittivity interfacial layer forms between the Pt electrode and PZT films, this does not occur in PMZT. We propose that Mn dopants are able to reduce oxygen vacancy mobility in PZT films and Mn2+ ions consume the oxygen vacancies generated during repeated switching, forming Mn4+ ions. These mechanisms are probably responsible for their low observed fatigue characteristics. Mn doping brings additional benefits to the electrical properties of PZT films. The relevant pyroelectric coefficients (p) of a 700 nm thick film are 3.52x10(-4) C m(-2) K-1 and detectivity figures of merit F-D=3.85x10(-5) Pa-0.5 at 33 Hz for Mn-doped PZT, compared with p=2.11x10(-4) C m(-2) K-1 and F-D=1.07x10(-5) Pa-0.5 for the undoped PZT films. This means that the Mn-doped PZT thin films are excellent candidates as device materials for both memory and pyroelectric applications. (C) 2003 American Institute of Physics.
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页码:5228 / 5233
页数:6
相关论文
共 32 条
[1]   Significant suppression of leakage current in (Ba,Sr)TiO3 thin films by Ni or Mn doping [J].
Ahn, KH ;
Baik, S ;
Kim, SS .
JOURNAL OF APPLIED PHYSICS, 2002, 92 (05) :2651-2654
[2]  
Algueró M, 2001, INTEGR FERROELECTR, V41, P1705, DOI 10.1080/10584580108012807
[3]   INTERNAL BIAS IN FERROELECTRIC CERAMICS - ORIGIN AND TIME-DEPENDENCE [J].
ARLT, G ;
NEUMANN, H .
FERROELECTRICS, 1988, 87 :109-120
[4]   The physics of ferroelectric memories [J].
Auciello, O ;
Scott, JF ;
Ramesh, R .
PHYSICS TODAY, 1998, 51 (07) :22-27
[5]   Ferroelectric properties of sandwich structured (Bi,La)4Ti3O12/Pb(Zr,Ti)O3/(Bi,La)4Ti3O12 thin films on Pt/Ti/SiO2/Si substrates [J].
Bao, D ;
Wakiya, N ;
Shinozaki, K ;
Mizutani, N .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2002, 35 (03) :L1-L5
[6]   A model for fatigue in ferroelectric perovskite thin films (vol 76, pg 1060, 2000) [J].
Dawber, M ;
Scott, JF .
APPLIED PHYSICS LETTERS, 2000, 76 (24) :3655-3655
[7]   A model for fatigue in ferroelectric perovskite thin films [J].
Dawber, M ;
Scott, JF .
APPLIED PHYSICS LETTERS, 2000, 76 (08) :1060-1062
[8]   Fatigue of Pb(Zr0.53Ti0.47)O3 ferroelectric thin films [J].
Du, XF ;
Chen, IW .
JOURNAL OF APPLIED PHYSICS, 1998, 83 (12) :7789-7798
[9]   The interface screening model as origin of imprint in PbZrxTi1-xO3 thin films.: I.: Dopant, illumination, and bias dependence [J].
Grossmann, M ;
Lohse, O ;
Bolten, D ;
Boettger, U ;
Schneller, T ;
Waser, R .
JOURNAL OF APPLIED PHYSICS, 2002, 92 (05) :2680-2687
[10]   Ferroelectric ceramics: History and technology [J].
Haertling, GH .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1999, 82 (04) :797-818