Improved ferroelectric and pyroelectric properties in Mn-doped lead zirconate titanate thin films

被引:115
作者
Zhang, Q [1 ]
Whatmore, RW [1 ]
机构
[1] Cranfield Univ, SIMS, Dept Adv Mat, Cranfield MK43 0AL, Beds, England
关键词
D O I
10.1063/1.1613370
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have investigated the effects of Mn doping on the ferroelectric and pyroelectric properties of Pb(Zr0.3Ti0.7)O-3 (PZT) thin films on substrates Pt/Ti/SiO2/Si. The Mn-doped (1 mol %) PZT (PMZT) showed almost no hysteretic fatigue up to 10(10) switching bipolar pulse cycles, coupled with excellent retention properties. We present evidence that while a low permittivity interfacial layer forms between the Pt electrode and PZT films, this does not occur in PMZT. We propose that Mn dopants are able to reduce oxygen vacancy mobility in PZT films and Mn2+ ions consume the oxygen vacancies generated during repeated switching, forming Mn4+ ions. These mechanisms are probably responsible for their low observed fatigue characteristics. Mn doping brings additional benefits to the electrical properties of PZT films. The relevant pyroelectric coefficients (p) of a 700 nm thick film are 3.52x10(-4) C m(-2) K-1 and detectivity figures of merit F-D=3.85x10(-5) Pa-0.5 at 33 Hz for Mn-doped PZT, compared with p=2.11x10(-4) C m(-2) K-1 and F-D=1.07x10(-5) Pa-0.5 for the undoped PZT films. This means that the Mn-doped PZT thin films are excellent candidates as device materials for both memory and pyroelectric applications. (C) 2003 American Institute of Physics.
引用
收藏
页码:5228 / 5233
页数:6
相关论文
共 32 条
[11]   Nanoscale investigation of domain retention in preferentially oriented PbZr0.53Ti0.47O3 thin films on Pt and on LaNiO3 [J].
Hong, JW ;
Jo, W ;
Kim, DC ;
Cho, SM ;
Nam, HJ ;
Lee, HM ;
Bu, JU .
APPLIED PHYSICS LETTERS, 1999, 75 (20) :3183-3185
[12]   Structural development in the early stages of annealing of sol-gel prepared lead zirconate titanate thin films [J].
Huang, Z ;
Zhang, Q ;
Whatmore, RW .
JOURNAL OF APPLIED PHYSICS, 1999, 86 (03) :1662-1669
[13]   Low temperature crystallization of lead zirconate titanate thin films by a sol-gel method [J].
Huang, Z ;
Zhang, Q ;
Whatmore, RW .
JOURNAL OF APPLIED PHYSICS, 1999, 85 (10) :7355-7361
[14]   Electric fatigue properties of sol-gel-derived Pb(Zr, Ti)O3/PbZrO3 multilayered thin films [J].
Jang, JH ;
Yoon, KH .
APPLIED PHYSICS LETTERS, 1999, 75 (01) :130-132
[15]   Dynamics of polarization loss in (Pb, La)(Zy, Ti)O3 thin film capacitors [J].
Jenkins, IG ;
Song, TK ;
Madhukar, S ;
Prakash, AS ;
Aggarwal, S ;
Ramesh, R .
APPLIED PHYSICS LETTERS, 1998, 72 (25) :3300-3302
[16]   PROCESSING AND ELECTRICAL-PROPERTIES OF PB(ZRXTI1-X)O3 (X = 0.2-0.75) FILMS - COMPARISON OF METALLOORGANIC DECOMPOSITION AND SOL-GEL PROCESSES [J].
KLEE, M ;
EUSEMANN, R ;
WASER, R ;
BRAND, W ;
VANHAL, H .
JOURNAL OF APPLIED PHYSICS, 1992, 72 (04) :1566-1576
[17]   RETENTION AND IMPRINT PROPERTIES OF FERROELECTRIC THIN-FILMS [J].
LEE, JJ ;
THIO, CL ;
DESU, SB .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1995, 151 (01) :171-182
[18]   INTERNAL BIAS IN ACCEPTOR-DOPED BATIO3 CERAMICS - NUMERICAL EVALUATION OF INCREASE AND DECREASE [J].
LOHKAMPER, R ;
NEUMANN, H ;
ARLT, G .
JOURNAL OF APPLIED PHYSICS, 1990, 68 (08) :4220-4224
[19]   CHARACTERISTIC CHANGE DUE TO POLARIZATION FATIGUE OF SOL-GEL FERROELECTRIC PB(ZR0.4TI0.6)O-3 THIN-FILM CAPACITORS [J].
MIHARA, T ;
WATANABE, H ;
DEARAUJO, CAP .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (9B) :5281-5286
[20]   DOMAIN-WALL CLAMPING IN FERROELECTRICS BY ORIENTATION OF DEFECTS [J].
ROBELS, U ;
ARLT, G .
JOURNAL OF APPLIED PHYSICS, 1993, 73 (07) :3454-3460