Nanoscale investigation of domain retention in preferentially oriented PbZr0.53Ti0.47O3 thin films on Pt and on LaNiO3

被引：70

作者：

Hong, JW

Jo, W

Kim, DC

Cho, SM

Nam, HJ

Lee, HM

Bu, JU

机构：

[1] PSIA Corp, Seoul 137070, South Korea

[2] LG Corp Inst Technol, Devices & Mat Lab, Seoul 137724, South Korea

来源：

APPLIED PHYSICS LETTERS | 1999年 / 75卷 / 20期

关键词：

D O I：

10.1063/1.125271

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report results on domain retention in preferentially oriented PbZr0.53Ti0.47O3 (PZT) thin films on Pt and on LaNiO3 (LNO) electrodes. Domain images are obtained by detecting an electrostatic force exerted on the biased conductive probe. We demonstrate that polarization loss of PZT domains on LNO electrodes occurs less under no external field rather than that of PZT on Pt. The time dependence of the remnant polarization is found to follow a stretched exponential decay. (C) 1999 American Institute of Physics. [S0003-6951(99)01146-8].

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页码：3183 / 3185

页数：3

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