Erbium impurity atoms in silicon

被引:20
作者
Masterov, VF [1 ]
Nasredinov, FS [1 ]
Seregin, PP [1 ]
Terukov, EI [1 ]
Mezdrogina, MM [1 ]
机构
[1] St Petersburg State Tech Univ, St Petersburg 195251, Russia
基金
俄罗斯基础研究基金会;
关键词
D O I
10.1134/1.1187454
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
It is shown using Er-169(Tm-169) Mossbauer emission spectroscopy that the photoluminescent centers in crystalline erbium-doped silicon are [Er-O] clusters and that the local symmetry of the Er3+ ions in these clusters is similar to that in Er2O3. The photoluminescent centres in amorphous hydrogenated erbium-doped silicon are clusters, whose local structure also corresponds to erbium oxide. (C) 1998 American Institute of Physics.(()
引用
收藏
页码:636 / 639
页数:4
相关论文
共 9 条
[1]   LOCAL-STRUCTURE OF 1.54-MU-M-LUMINESCENCE ER-3+ IMPLANTED IN SI [J].
ADLER, DL ;
JACOBSON, DC ;
EAGLESHAM, DJ ;
MARCUS, MA ;
BENTON, JL ;
POATE, JM ;
CITRIN, PH .
APPLIED PHYSICS LETTERS, 1992, 61 (18) :2181-2183
[2]   ROOM-TEMPERATURE PHOTOLUMINESCENCE OF ERBIUM-DOPED HYDROGENATED AMORPHOUS-SILICON [J].
BRESLER, MS ;
GUSEV, OB ;
KUDOYAROVA, VK ;
KUZNETSOV, AN ;
PAK, PE ;
TERUKOV, EI ;
YASSIEVICH, IN ;
ZAKHARCHENYA, BP ;
FUHS, W ;
STURN, A .
APPLIED PHYSICS LETTERS, 1995, 67 (24) :3599-3601
[3]   1.54-MU-M LUMINESCENCE OF ERBIUM-IMPLANTED III-V SEMICONDUCTORS AND SILICON [J].
ENNEN, H ;
SCHNEIDER, J ;
POMRENKE, G ;
AXMANN, A .
APPLIED PHYSICS LETTERS, 1983, 43 (10) :943-945
[4]   1.54-MU-M ELECTROLUMINESCENCE OF ERBIUM-DOPED SILICON GROWN BY MOLECULAR-BEAM EPITAXY [J].
ENNEN, H ;
POMRENKE, G ;
AXMANN, A ;
EISELE, K ;
HAYDL, W ;
SCHNEIDER, J .
APPLIED PHYSICS LETTERS, 1985, 46 (04) :381-383
[5]  
Masterov V. F., 1996, Technical Physics Letters, V22, P960
[6]   The possible mechanism of excitation of the f-f emission from Er-O clusters in silicon [J].
Masterov, VF ;
Gerchikov, LG .
RARE EARTH DOPED SEMICONDUCTORS II, 1996, 422 :227-238
[7]   ERBIUM IN CRYSTAL SILICON - OPTICAL ACTIVATION, EXCITATION, AND CONCENTRATION LIMITS [J].
POLMAN, A ;
VANDENHOVEN, GN ;
CUSTER, JS ;
SHIN, JH ;
SERNA, R ;
ALKEMADE, PFA .
JOURNAL OF APPLIED PHYSICS, 1995, 77 (03) :1256-1262
[8]   Evolution of the local environment around Er upon thermal annealing in Er and O co-implanted Si [J].
Terrasi, A ;
Franzo, G ;
Coffa, S ;
Priolo, F ;
DAcapito, F ;
Mobilio, S .
APPLIED PHYSICS LETTERS, 1997, 70 (13) :1712-1714
[9]  
Terukov EI, 1996, SEMICONDUCTORS+, V30, P440