Block lift-out sample preparation for 3D experiments in a dual beam focused ion beam microscope

We present the in-situ block lift-out sample preparation as an improvement of three dimensional sectioning experiments in a dual beam focused ion beam microscope. A soldering point between two iron pieces with a copper/silver solder is used as a sample, demonstrating the benefits of the preparation compared to performing sectioning experiments directly within the solid bulk sample. An automated routine is used to acquire a series of elemental maps by energy dispersive X-ray spectrometry from which a three dimensional copper distribution model is calculated.