Characterizing Joule heating in polymer light-emitting diodes using a scanning thermal microscope

被引：41

作者：

Boroumand, FA

Hammiche, A

Hill, G

Lidzey, DG

机构：

[1] Univ Sheffield, Dept Phys & Astron, Sheffield S3 7RH, S Yorkshire, England

[2] Univ Lancaster, Dept Phys, Lancaster LA1 4YB, England

[3] Univ Sheffield, Dept Elect & Elect Engn, Sheffield S1 3JD, S Yorkshire, England

来源：

ADVANCED MATERIALS | 2004年 / 16卷 / 03期

关键词：

D O I：

10.1002/adma.200306128

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Scanning thermal microscopy (SThM) has been used to study Joule heating in conjugated polymer light-emitting diodes (LEDs; see Figure). The operational temperature of the LED is found to be a strong function of device area: smaller LEDs exchange heat more efficiently with their surrounding environment. The results suggest that at high current density, Joule heating may be linked to device failure.

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页码：252 / +

页数：6

相关论文

共 30 条

[1] Nearly 100% internal phosphorescence efficiency in an organic light-emitting device [J].

Adachi, C ;

Baldo, MA ;

Thompson, ME ;

Forrest, SR .

JOURNAL OF APPLIED PHYSICS, 2001, 90 (10) :5048-5051

[2] Dispersive electron transport in an electroluminescent polyfluorene copolymer measured by the current integration time-of-flight method [J].

Campbell, AJ ;

Bradley, DDC ;

Antoniadis, H .

APPLIED PHYSICS LETTERS, 2001, 79 (14) :2133-2135

[3]

Coldren L.A., 1995, Diode Lasers and Photonic Integrated Circuits, P56

[4] Temperature dependence of electroluminescence degradation in organic light emitting devices without and with a copper phthalocyanine buffer layer [J].

dos Anjos, PNM ;

Aziz, H ;

Hu, NX ;

Popovic, ZD .

ORGANIC ELECTRONICS, 2002, 3 (01) :9-13

[5]

GELSEN O, 2003, OPTO LASER EUR, V107, P33

[6] Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device [J].

Heiderhoff, R ;

Palaniappan, M ;

Phang, JCH ;

Balk, LJ .

MICROELECTRONICS RELIABILITY, 2000, 40 (8-10) :1383-1388

[7] Improved operational stability of polyfluorene-based organic light-emitting diodes with plasma-treated indium-tin-oxide anodes [J].

Kim, JS ;

Friend, RH ;

Cacialli, F .

APPLIED PHYSICS LETTERS, 1999, 74 (21) :3084-3086

[8] Investigation of Tunnel-Regenerated Multi-Active-Region Light-Emitting Diodes (TRMAR LED) by Scanning Thermal Microscopy (SThM) [J].

Lee, TH ;

Guo, X ;

Shen, GD ;

Ji, Y ;

Wang, GH ;

Du, JY ;

Wang, XZ ;

Gao, G ;

Altes, A ;

Balk, LJ ;

Phang, JCH .

MICROELECTRONICS RELIABILITY, 2002, 42 (9-11) :1711-1714

[9] Scanning thermal microscopy of a vertical-cavity surface-emitting laser [J].

Luo, K ;

Herrick, RW ;

Majumdar, A ;

Petroff, P .

APPLIED PHYSICS LETTERS, 1997, 71 (12) :1604-1606

[10] Frequency up-conversion as a temperature probe of organic opto-electronic devices [J].

Lupton, JM .

APPLIED PHYSICS LETTERS, 2002, 80 (02) :186-188