Scanning thermal microscopy of a vertical-cavity surface-emitting laser

被引:54
作者
Luo, K
Herrick, RW
Majumdar, A
Petroff, P
机构
[1] UNIV CALIF BERKELEY,DEPT MECH ENGN,BERKELEY,CA 94720
[2] ANADIG INC,WARREN,NJ 07059
[3] UNIV CALIF SANTA BARBARA,DEPT MAT,SANTA BARBARA,CA 93106
关键词
D O I
10.1063/1.119991
中图分类号
O59 [应用物理学];
学科分类号
摘要
A scanning thermal microscope was used to measure the temperature distribution inside a vertical-cavity surface-emitting laser. The peak temperature occurred at the intersection of the optical axis and the active quantum wells, and increased with input power at a rate of 0.74 degrees C/mW. Comparison with model predictions showed that the n mirrors and the substrate produce higher heat generation rates, possibly due to Joule heating and/or the absorption of spontaneous emissions that are often neglected in models. (C) 1997 American Institute of Physics.
引用
收藏
页码:1604 / 1606
页数:3
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