Determination of elastic constants in thin films using hydrogen loading

被引:42
作者
Laudahn, U [1 ]
Fähler, S
Krebs, HU
Pundt, A
Bicker, M
Hülsen, UV
Geyer, U
Kirchheim, R
机构
[1] Univ Gottingen, Inst Mat Phys, D-37073 Gottingen, Germany
[2] Univ Gottingen, Inst Phys 1, D-37073 Gottingen, Germany
关键词
D O I
10.1063/1.123028
中图分类号
O59 [应用物理学];
学科分类号
摘要
By measuring stress and strain that build up in thin films during hydrogen absorption, the elastic constants of the films can be determined, if a one-dimensional elastic behavior occurs only. This will be demonstrated for hydrogen absorption in Nb films. The in-plane stress is determined from the substrate curvature that is measured by using a two-beam laser setup. The out-of-plane strain is measured via x-ray diffraction. Furthermore, this method allows us to distinguish whether the film is plastically or elastically deformed by checking the reversibility of the stress-strain curve. In the case of a 250-nm-thick Nb film, the elastic constants obtained are similar to that of bulk Nb. (C) 1999 American Institute of Physics. [S0003-6951(99)00405-2].
引用
收藏
页码:647 / 649
页数:3
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