Imaging buried interfacial lattices with quantized electrons

被引：84

作者：

Altfeder, IB ^{[1
]}

Chen, DM

Matveev, KA

机构：

[1] Rowland Inst Sci Inc, Cambridge, MA 02142 USA

[2] Duke Univ, Dept Phys, Durham, NC 27708 USA

来源：

PHYSICAL REVIEW LETTERS | 1998年 / 80卷 / 22期

关键词：

D O I：

10.1103/PhysRevLett.80.4895

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We demonstrate that the well-known Si(111)-(7 x 7) superlattice buried under as much as 100 Angstrom of crystalline Pb can be directly imaged with a scanning tunneling microscope at 77 K. The unexpected transparency of the metal and the high lateral resolution are the result of a nondiffractive scattering of the electrons at the interface. We attribute this phenomenon to a large anisotropy of the effective masses associated with the free in-plane and the quantized transverse motion of the electrons.

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页码：4895 / 4898

页数：4

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