Voltage Difference Residual-Based Open-Circuit Fault Diagnosis Approach for Three-Level Converters in Electric Traction Systems

被引:108
作者
Chao, Yang [1 ,2 ]
Gui, Weihua [1 ,2 ]
Chen, Zhiwen [1 ,2 ]
Zhang, Jingrong [1 ,2 ]
Peng, Tao [1 ,2 ]
Yang, Chunhua [1 ,2 ]
Karimi, Hamid Reza [3 ]
Ding, Steven X. [4 ]
机构
[1] Cent S Univ, Sch Automat, Key Lab Energy Saving Control & Safety Monitoring, Changsha 410083, Peoples R China
[2] Peng Cheng Lab, Shenzhen 518000, Peoples R China
[3] Politecn Milan, Dept Mech Engn, I-20156 Milan, Italy
[4] Univ Duisburg Essen, Inst Automat Control & Complex Syst AKS, D-47057 Duisburg, Germany
基金
中国国家自然科学基金;
关键词
Hierarchical fault diagnosis; open-circuit (OC) fault; three-level inverters; three-level rectifiers; voltage difference residual; TO-BACK CONVERTERS; INVERTERS; TRENDS; MODEL; PMSM;
D O I
10.1109/TPEL.2019.2924487
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
080906 [电磁信息功能材料与结构]; 082806 [农业信息与电气工程];
摘要
This paper proposes a voltage difference residual-based fault diagnosis approach for three-level converters in electric traction systems. Compared to the existing open-circuit fault diagnosis approaches, the proposed approach cannot only detect and identify the faulty devices among the transistors and clamp diodes in both of rectifier and inverter, but also hierarchically diagnose the leg-level and device-level faults. Furthermore, no additional sensors are required and all of specified parameters can be directly identified. Specifically, the current related term in the dc-link voltage difference equations are analyzed and modeled under the normal case and open-circuit fault cases in the transistors and clamp diodes, respectively. Subsequently, the estimation models of the dc-link voltage difference are developed, and then, the residuals and their evaluation functions between estimation and actual are generated. Furthermore, by analyzing the residual evaluation functions for various cases and building the current similarity functions, the hierarchical diagnosis algorithms are proposed to identify the leg-level and device-level faults. Finally, hardware-in-the-loop experiments are performed. The results show the effectiveness and robustness of the proposed approach.
引用
收藏
页码:3012 / 3028
页数:17
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