Nanoscale optical imaging on an electroluminescent polymer by conducting atomic force microscopy

被引：7

作者：

Lin, HN ^{[1
]}

Chen, SH

Lee, YZ

Chen, SA

机构：

[1] Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 300, Taiwan

[2] Natl Tsing Hua Univ, Dept Electrophys, Hsinchu 300, Taiwan

[3] Natl Sci Council, Precis Instrument Dev Ctr, Hsinchu 300, Taiwan

[4] Natl Tsing Hua Univ, Dept Chem Engn, Hsinchu 300, Taiwan

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2001年 / 19卷 / 01期

关键词：

D O I：

10.1116/1.1343099

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We demonstrate optical imaging with a resolution of around 50 nm on an electroluminescent polymer by conducting atomic force microscopy. The results indicate that brighter light emission occurs from asperities on the polymer surface. By comparing surface morphologies of the polymer and the indium tin oxide substrate, it is found that similar asperities exist on both surfaces and the polymer becomes thinner on these locations. Therefore, stronger luminescence intensity from asperities is caused by higher electric field due to reduced polymer thickness. The present method can also be extended to obtain simultaneous optical and electrical transport properties. (C) 2001 American Vacuum Society.

引用

页码：308 / 310

页数：3

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