Improvement of biological time-of-flight-secondary ion mass spectrometry imaging with a bismuth cluster ion source

被引:286
作者
Touboul, D
Kollmer, F
Niehuis, E
Brunelle, A
Laprévote, O
机构
[1] CNRS, Inst Chim Subst Nat, F-91198 Gif Sur Yvette, France
[2] ION TOF GmbH, D-48149 Munster, Germany
关键词
D O I
10.1016/j.jasms.2005.06.005
中图分类号
Q5 [生物化学];
学科分类号
071010 ; 081704 ;
摘要
A new liquid metal ion gun (LMIG) filled with bismuth has been fitted to a time-of-flight-secondary ion mass spectrometer (TOF-SIMS). This source provides beams of Biq(n)(q+) clusters with n = 1-7 and q = 1 and 2. The appropriate clusters have much better intensities and efficiencies than the Au-3(+) gold clusters recently used in TOF-SIMS imaging, and allow better lateral and mass resolution. The different beams delivered by this ion source have been tested for biological imaging of rat brain sections. The results show a great improvement of the imaging capabilities in terms of accessible mass range and useful lateral resolution. Secondary ion yields Y, disappearance cross sections sigma, efficiencies E = Y/sigma, and useful lateral resolutions Delta L have been compared using the different bismuth clusters, directly onto the surface of rat brain sections and for several positive and negative secondary ions with m/z ranging from 23 up to more than 750. The efficiency and the imaging capabilities of the different primary ions are compared by taking into account the primary ion current for reasonable acquisition times. The two best e Bi-3(+) and Bi-2(+) The Bi-3(+) primary ions are ion beam has a current at least five times larger than Au-3(+) and therefore is an excellent beam for large-area imaging. Bi-5(2+) ions exhibit large secondary ions yields and a reasonable intensity making them suitable for small-area images with an excellent sensitivity and a possible useful lateral resolution < 400nm.
引用
收藏
页码:1608 / 1618
页数:11
相关论文
共 30 条
[1]   Direct molecular Imaging of Lymnaea stagnalis nervous tissue at subcellular spatial resolution by mass spectrometry [J].
Altelaar, AFM ;
van Minnen, J ;
Jiménez, CR ;
Heeren, RMA ;
Piersma, SR .
ANALYTICAL CHEMISTRY, 2005, 77 (03) :735-741
[2]   Time-of-flight secondary ion mass spectrometry: techniques and applications for the characterization of biomaterial surfaces [J].
Belu, AM ;
Graham, DJ ;
Castner, DG .
BIOMATERIALS, 2003, 24 (21) :3635-3653
[3]   IMPACT OF SLOW GOLD CLUSTERS ON VARIOUS SOLIDS - NONLINEAR EFFECTS IN SECONDARY ION EMISSION [J].
BENGUERBA, M ;
BRUNELLE, A ;
DELLANEGRA, S ;
DEPAUW, J ;
JORET, H ;
LEBEYEC, Y ;
BLAIN, MG ;
SCHWEIKERT, EA ;
BENASSAYAG, G ;
SUDRAUD, P .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 62 (01) :8-22
[4]   Enhanced secondary-ion emission under gold-cluster bombardment with energies from keV to MeV per atom [J].
Brunelle, A. ;
Della-Negra, S. ;
Depauw, J. ;
Jacquet, D. ;
Le Beyec, Y. ;
Pautrat, M. ;
Baudin, K. ;
Andersen, H.H. .
Physical Review A - Atomic, Molecular, and Optical Physics, 2001, 63 (02) :022902-022901
[5]   Molecular imaging of biological samples: Localization of peptides and proteins using MALDI-TOF MS [J].
Caprioli, RM ;
Farmer, TB ;
Gile, J .
ANALYTICAL CHEMISTRY, 1997, 69 (23) :4751-4760
[6]   Profiling and imaging proteins in tissue sections by MS [J].
Chaurand, P ;
Schwartz, SA ;
Caprioli, RM .
ANALYTICAL CHEMISTRY, 2004, 76 (05) :86A-93A
[7]   Electron flood gun damage in the analysis of polymers and organics in time-of-flight SIMS [J].
Gilmore, IS ;
Seah, MP .
APPLIED SURFACE SCIENCE, 2002, 187 (1-2) :89-100
[8]  
*ION TOF, 2002, TOF SIMS 4 PROD DESC
[9]   Cluster primary ion bombardment of organic materials [J].
Kollmer, F .
APPLIED SURFACE SCIENCE, 2004, 231 :153-158
[10]   Secondary ion emission from polymer surfaces under Ar+, Xe+ and SF5+ ion bombardment [J].
Kotter, F ;
Benninghoven, A .
APPLIED SURFACE SCIENCE, 1998, 133 (1-2) :47-57