Nanocrystals formation and fractal microstructural assessment in Au/Ge bilayer films upon annealing

被引:17
作者
Chen, ZW [1 ]
Lai, JKL [1 ]
Shek, CH [1 ]
Chen, HD [1 ]
机构
[1] City Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R China
关键词
nanocrystal; fractal; Au/Ge bilayer films; HRTEM;
D O I
10.1016/j.apsusc.2004.12.022
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Nanocrystals formation and fractal microstructural assessment in Au/Ge bilayer films upon annealing have been investigated by transmission electron microscopy and high-resolution transmission electron microscopy observations. Experimental results indicated that the microstructure of the metal An film plays an important role in metal-induced crystallization for Au/Ge bilayer films upon annealing. Synchronously, the crystallization processes of amorphous Ge accompanied by the formation of Ge fractal clusters, which were composed of Ge nanocrystals. We found that the grain boundaries of polycrystalline An film were the initial nucleation sites of Ge nanocrystals. High-resolution transmission electron microscopy observations showed successive nucleation of amorphous Ge at An grain boundaries near fractal tips. The crystallization process was suggested to be diffusion controlled and a random successive nucleation and growth mechanism. (c) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:3 / 8
页数:6
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