Electrostatics of nanowire transistors

被引:64
作者
Guo, J [1 ]
Wang, J [1 ]
Polizzi, E [1 ]
Datta, S [1 ]
Lundstrom, M [1 ]
机构
[1] Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA
关键词
electrostatic analysis; nanotecnology; transistors;
D O I
10.1109/TNANO.2003.820518
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The electrostatics of nanowire transistors are studied by solving the Poisson equation self-consistently with the equilibrium carrier statistics of the nanowire. For a one-dimensional, intrinsic nanowire channel, charge transfer from the metal contacts is important. We examine how the charge transfer depends on the insulator and the metal/semiconductor Schottky barrier height. We also show that charge density on the nanowire is a sensitive function of the contact geometry. For a nanowire transistor with large gate underlaps, charge transferred from bulk electrodes can effectively "dope" the intrinsic, ungated region and allow the transistor to operate. Reducing the gate oxide thickness and the source/drain contact size decreases the length by which the source/drain electric field penetrates into the channel, thereby, improving the transistor characteristics.
引用
收藏
页码:329 / 334
页数:6
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