Ballistic carbon nanotube field-effect transistors

被引:2603
作者
Javey, A
Guo, J
Wang, Q
Lundstrom, M
Dai, HJ [1 ]
机构
[1] Stanford Univ, Dept Chem, Stanford, CA 94305 USA
[2] Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA
基金
美国国家科学基金会;
关键词
D O I
10.1038/nature01797
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
A common feature of the single-walled carbon-nanotube field-effect transistors fabricated to date has been the presence of a Schottky barrier at the nanotube-metal junctions(1-3). These energy barriers severely limit transistor conductance in the 'ON' state, and reduce the current delivery capability-a key determinant of device performance. Here we show that contacting semiconducting single-walled nanotubes by palladium, a noble metal with high work function and good wetting interactions with nanotubes, greatly reduces or eliminates the barriers for transport through the valence band of nanotubes. In situ modification of the electrode work function by hydrogen is carried out to shed light on the nature of the contacts. With Pd contacts, the 'ON' states of semiconducting nanotubes can behave like ohmically contacted ballistic metallic tubes, exhibiting room-temperature conductance near the ballistic transport limit of 4e(2)/h (refs 4-6), high current-carrying capability (similar to25 muA per tube), and Fabry-Perot interferences (5) at low temperatures. Under high voltage operation, the current saturation appears to be set by backscattering of the charge carriers by optical phonons. High-performance ballistic nanotube field-effect transistors with zero or slightly negative Schottky barriers are thus realized.
引用
收藏
页码:654 / 657
页数:4
相关论文
共 31 条
[1]   Field-modulated carrier transport in carbon nanotube transistors [J].
Appenzeller, J ;
Knoch, J ;
Derycke, V ;
Martel, R ;
Wind, S ;
Avouris, P .
PHYSICAL REVIEW LETTERS, 2002, 89 (12) :126801-126801
[2]   Metallic resistivity in crystalline ropes of single-wall carbon nanotubes [J].
Fischer, JE ;
Dai, H ;
Thess, A ;
Lee, R ;
Hanjani, NM ;
Dehaas, DL ;
Smalley, RE .
PHYSICAL REVIEW B, 1997, 55 (08) :R4921-R4924
[3]  
Guo J, 2002, INTERNATIONAL ELECTRON DEVICES 2002 MEETING, TECHNICAL DIGEST, P711, DOI 10.1109/IEDM.2002.1175937
[4]   A computational study of thin-body, double-gate, Schottky barrier MOSFETs [J].
Guo, J ;
Lundstrom, MS .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2002, 49 (11) :1897-1902
[5]   Performance projections for ballistic carbon nanotube field-effect transistors [J].
Guo, J ;
Lundstrom, M ;
Datta, S .
APPLIED PHYSICS LETTERS, 2002, 80 (17) :3192-3194
[6]   Carbon nanotubes as Schottky barrier transistors [J].
Heinze, S ;
Tersoff, J ;
Martel, R ;
Derycke, V ;
Appenzeller, J ;
Avouris, P .
PHYSICAL REVIEW LETTERS, 2002, 89 (10)
[7]  
HEINZE S, 2003, UNEXPECTED SCALING P
[8]   High-κ dielectrics for advanced carbon-nanotube transistors and logic gates [J].
Javey, A ;
Kim, H ;
Brink, M ;
Wang, Q ;
Ural, A ;
Guo, J ;
McIntyre, P ;
McEuen, P ;
Lundstrom, M ;
Dai, HJ .
NATURE MATERIALS, 2002, 1 (04) :241-246
[9]   Electrical properties and devices of large-diameter single-walled carbon nanotubes [J].
Javey, A ;
Shim, M ;
Dai, HJ .
APPLIED PHYSICS LETTERS, 2002, 80 (06) :1064-1066
[10]   Temperature-dependent resistivity of single-wall carbon nanotubes [J].
Kane, CL ;
Mele, EJ ;
Lee, RS ;
Fischer, JE ;
Petit, P ;
Dai, H ;
Thess, A ;
Smalley, RE ;
Verschueren, ARM ;
Tans, SJ ;
Dekker, C .
EUROPHYSICS LETTERS, 1998, 41 (06) :683-688