Performance projections for ballistic carbon nanotube field-effect transistors

被引:163
作者
Guo, J [1 ]
Lundstrom, M [1 ]
Datta, S [1 ]
机构
[1] Purdue Univ, W Lafayette, IN 47907 USA
关键词
D O I
10.1063/1.1474604
中图分类号
O59 [应用物理学];
学科分类号
摘要
The performance limits of carbon nanotube field-effect transistors (CNTFETs) are examined theoretically by extending a one-dimensional treatment used for silicon metal-oxide-semiconductor field-effect transistors (MOSFETs). Compared to ballistic MOSFETs, ballistic CNTFETs show similar I-V characteristics but the channel conductance is quantized. For low-voltage, digital applications, the CNTFET with a planar gate geometry provides an on-current that is comparable to that expected for a ballistic MOSFET. Significantly better performance, however, could be achieved with high gate capacitance structures. Because the computed performance limits greatly exceed the performance of recently reported CNTFETs, there is considerable opportunity for progress in device performance. (C) 2002 American Institute of Physics.
引用
收藏
页码:3192 / 3194
页数:3
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