Physical origins of fine structure in the resonant tunneling through laterally confined 1D-0D-1D structures

被引:2
作者
Csontos, D [1 ]
Xu, HQ [1 ]
机构
[1] Lund Univ, SE-22100 Lund, Sweden
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2001年 / 40卷 / 3B期
关键词
resonant tunneling; 1D-0D-1D system; scattering-matrix method; I-V characteristics;
D O I
10.1143/JJAP.40.1966
中图分类号
O59 [应用物理学];
学科分类号
摘要
Experimental studies of electron transport through gated vertical resonant tunneling structures have been seen to display complicated features in the measured I-V characteristics. The interpretation of the data has been difficult due to the lack of detailed knowledge of the lateral confining potential profile in different parts of the device as well as the associated tunneling properties. In this work we theoretically investigate the electron transport through laterally confined double-barrier resonant tunneling structures connected via narrow emitters and collectors to two-dimensional electron reservoirs. In particular we investigate the effects of variation of the lateral confining potential in different parts of the device. The calculated I-V spectra display complicated fine features which can be explained by the complex interplay between the density of states in the dot and the density of states in the narrow emitter and collector as the lateral confining potential is varied. The calculations may provide physical insight to the complicated features seen in the experiments.
引用
收藏
页码:1966 / 1969
页数:4
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