A novel laser trimming technique for microelectronics

被引:8
作者
Meunier, M [1 ]
Gagnon, Y [1 ]
Savaria, Y [1 ]
Lacourse, A [1 ]
Cadotte, M [1 ]
机构
[1] Ecole Polytech, Dept Genie Phys, Montreal, PQ H3C 3A7, Canada
来源
LASER APPLICATIONS IN MICROELECTRONIC AND OPTOELECTRONIC MANUFACTURING VI | 2001年 / 4274卷
关键词
Laser trimming; analogue microelectronics; resistance;
D O I
10.1117/12.432531
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A novel laser trimming technique, fully compatible with conventional CMOS processes, is described for analogue and mixed microelectronics applications. In this method, a laser beam is used to create a resistive device by melting a silicon area, thereby forming an electrical link between two adjacent p-n junction diodes. These laser diffusible resistances can be made in less than a second with an automated system and their values can be in the range of 100 Omega to a few M Omega, with an accuracy of 50ppm, by using an iterative process. In addition, these resistances can also be made to possess a thermal coefficient close to zero. We present the method used to create these resistances, the main device characterization and some insight on the process modeling.
引用
收藏
页码:385 / 392
页数:4
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