Structural investigation of substoichiometry and solid solution effects in Ti2Al(Cx,N1-x)y compounds

被引:64
作者
Cabioc'h, Thierry [1 ]
Eklund, Per [1 ,2 ]
Mauchamp, Vincent [1 ]
Jaouen, Michel [1 ]
机构
[1] Univ Poitiers, Dept Phys & Mecan Mat, Inst P, CNRS,UPR 3346,ENSMA,SP2MI, F-86962 Futuroscope, France
[2] Linkoping Univ, Thin Film Phys Div, IFM, S-58183 Linkoping, Sweden
关键词
Sintering; X-ray methods; Carbides; Nitrides; MAX phase; TI-AL-C; TA4ALC3; SYSTEM; TI2ALN;
D O I
10.1016/j.jeurceramsoc.2011.12.011
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The milling, cold compaction and thermal annealing (4 h-1400 degrees C-Ar flow) of Ti, TiC, Al and AlN powders were used to produce Ti2Al(CxN(1-x))(y) compounds with x = 0, 0.25, 0.5, 0.75, 1 and 0.7 <= y <= 1. X-ray diffraction analysis, scanning electron microscopy observations combined with microanalysis confirmed the formation of the almost pure Ti(2)A/CxN(1-x) carbonitrides for y=1 whereas increasing amounts of titanium aluminides were formed when y decreases. Proportions of the different phases deduced from Rietveld refinements of the X-ray diffractograms indicate that no or very poor substoichiometry in carbon was possible in carbide whereas C and N deficiency can be achieved in nitrides and carbonitrides Ti2AlCxN(1-x). Electron Energy Loss Spectroscopy investigations confirm that carbonitrides can have at least 20% of vacancies on the C or N site. The a lattice parameter varies linearly with x whereas it is not the case for the c lattice parameter, its values being lower for the carbonitrides. Furthermore, a strong broadening of the carbonitrides' XRD peaks is observed, a phenomenon that can be mainly attributed to C and N concentration gradients inside the samples. (C) 2012 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1803 / 1811
页数:9
相关论文
共 34 条
[11]   Ta3AlC2 and Ta4AlC3 -: Single-crystal investigations of two new ternary carbides of tantalum synthesized by the molten metal technique [J].
Etzkorn, Johannes ;
Ade, Martin ;
Hillebrecht, Harald .
INORGANIC CHEMISTRY, 2007, 46 (04) :1410-1418
[12]   Improved X-ray powder diffraction data for Ti2AlN [J].
Gamarnik, MY ;
Barsoum, MW ;
El-Raghy, T .
POWDER DIFFRACTION, 2000, 15 (04) :241-242
[13]   X-ray absorption spectroscopy, EELS, and full-potential augmented plane wave study of the electronic structure of Ti2AlC, Ti2AlN, Nb2AlC, and (Ti0.5Nb0.5)2AlC -: art. no. 024105 [J].
Hug, G ;
Jaouen, M ;
Barsoum, MW .
PHYSICAL REVIEW B, 2005, 71 (02)
[14]  
Hugh O., 1996, Handbook of Refractory Carbides and Nitrides
[15]   Microstructural characterization of layered ternary Ti2AlC [J].
Lin, ZJ ;
Zhuo, MJ ;
Zhou, YC ;
Li, MS ;
Wang, JY .
ACTA MATERIALIA, 2006, 54 (04) :1009-1015
[16]  
Lutterotti L, MAT ANAL USING DIFFR
[17]   X-ray high-pressure study of Ti2AlN and Ti2AlC [J].
Manoun, Bouchaib ;
Zhang, F. X. ;
Saxena, S. K. ;
El-Raghy, T. ;
Barsoum, M. W. .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2006, 67 (9-10) :2091-2094
[18]   Theoretical study of nitrogen vacancies in Ti4AIN3 -: art. no. 031911 [J].
Music, D ;
Ahuja, R ;
Schneider, JM .
APPLIED PHYSICS LETTERS, 2005, 86 (03) :1-3
[19]  
Nowotny H., 1970, Prog. Soild State Chem, V2, P27, DOI 10.1016/0022-4596(70)90028-9
[20]   Ti2Al(O,N) formation by solid-state reaction between substoichiometric TiN thin films and Al2O3 (0001) substrates [J].
Persson, P. O. A. ;
Hoglund, C. ;
Birch, J. ;
Hultman, L. .
THIN SOLID FILMS, 2011, 519 (08) :2421-2425